KLAPETEK, Petr,
Ivan OHLÍDAL,
Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial films.
Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2003, roč. 53, č. 3, s. 223-230. ISSN 0323-0465.