Výpis publikací

NEBOJSA, Alois, Olga FIKAROVÁ ZRZAVECKÁ, Karel NAVRÁTIL a Josef HUMLÍČEK. Temperature dependence of ellipsometric spectra of Fe and CrNiAl steel. physica status solidi (c). 2008, roč. 5, č. 5, s. 1176-1179. ISSN 1610-1642.

EITZINGER, Christian, Jan FIKAR, Christian FORSICH a Josef HUMLÍČEK. Spectroscopic Ellipsometry as a Tool for On-Line Monitoring and Control of Surface Treatment Processes. Materials Science Forum. Trans Tech Publications, 2006, roč. 518, č. 4, s. 423-430. ISSN 0255-5476.

ANTOŠ, Roman, Ivan OHLÍDAL, Jan MISTRÍK, K. MURAKAMI, Tomuo YAMAGUCHI, J. PIŠTORA, M. HORIE a Štefan VIŠŇOVSKÝ. Spectroscopic ellipsometry on lamellar gratings. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 225-229. ISSN 0169-4332.

ČECHAL, Jan, Petr TICHOPÁDEK, Alois NEBOJSA, Olga BONAVENTUROVÁ ZRZAVECKÁ, Michal URBÁNEK, Jiří SPOUSTA, Karel NAVRÁTIL a Tomáš ŠIKOLA. In situ analysis of PMPSi by spectroscopic ellipsometry and XPS. Surface and Interface Analysis. USA: John Wiley & Sons, 2004, roč. 2004, č. 36, s. 1218-1221. ISSN 0142-2421.

BRANDEJSOVÁ, Eva, Jan ČECHAL, Olga BONAVENTUROVÁ ZRZAVECKÁ, Alois NEBOJSA, Petr TICHOPÁDEK, Michal URBÁNEK, Karel NAVRÁTIL, Tomáš ŠIKOLA a Josef HUMLÍČEK. In situ analysis of PMPSi thin films by spectroscopic ellipsometry. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2004, roč. 9/2004, č. 9, s. 260-262. ISSN 0447-6441.

HOLDEN, Todd, Hanns HABERMEIER, Georg CRISTIANI, Andrzej GOLNIK, Alexander BORIS, Alexei PIMENOV a Josef HUMLÍČEK. Proximity induced metal-insulator transition in YBa2Cu3O7/La2/3Ca1/3MnO3 superlattices. Physical Review B. USA: The American Physical Society, 2004, roč. 69, č. 6, s. 4505 1-7, 7 s. ISSN 1098-0121.

FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Optical constants of ZnTe and ZnSe epitaxial thin films. Acta Physica Slovaca. Bratislava: Institute of Physics SAS, 2003, roč. 53, č. 2, s. 95-104. ISSN 0323-0465.

FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Influence of overlayers on determination of the optical constants of ZnSe thin films. Journal of Applied Physics. USA: American institute of physics, 2002, roč. 92, č. 4, s. 1873-1880. ISSN 0021-8979.

FRANTA, Daniel, Ivan OHLÍDAL a Petr KLAPETEK. Analysis of Slightly Rough Thin Films by Optical Methods and AFM. Mikrochim. Acta. Wien: Springer-Verlag, 2000, roč. 132, č. 1, s. 443-447. ISSN 0026-3672.

FRANTA, Daniel a Ivan OHLÍDAL. Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry. Surface and Interface Analysis. USA: John Wiley & Sons, 2000, roč. 30, č. 1, s. 574-579. ISSN 0142-2421.

OHLÍDAL, Ivan, Daniel FRANTA, Emil PINČÍK a Miloslav OHLÍDAL. Complete Optical Characterization of the SiO2/Si System by Spectroscopic Ellipsometry Spectroscopic Reflectometry and Atomic Force Microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 1999, roč. 28, č. 1, s. 240-244. ISSN 0142-2421.

OHLÍDAL, Ivan, Daniel FRANTA, Jaroslav HORA, Karel NAVRÁTIL, Jan WEBER a Pavel JANDA. Analysis of thin films with slightly rough boundaries. Mikrochim. Acta. Wien: Springer-Verlag, 1998, Suppl. 15, č. 1, s. 177-180. ISSN 0026-3672.