Publication Records

2004

1. Infrared Absorption Spectroscopy of Oxygen Precipitates in Czochralski Silicon

   ŠTOUDEK, Richard and Josef HUMLÍČEK. Infrared Absorption Spectroscopy of Oxygen Precipitates in Czochralski Silicon. In WDS'04 Proceedings of Contributed Papers. Praha, Česká republika: MATFYZPRESS, 2004, p. 475-479, 4 pp. ISBN 80-86732-32-0.

   More: https://is.muni.cz/publication/566412/en
2. Infrared Absorption Spectroscopy of Oxygen Precipitates in Nitrogen-doped Czochralski Silicon

   ŠTOUDEK, Richard, Michal LORENC and Josef HUMLÍČEK. Infrared Absorption Spectroscopy of Oxygen Precipitates in Nitrogen-doped Czochralski Silicon. In Proceedings of The Ninth Scientific and Business Conference SILICON 2004. Rožnov pod Radhoštěm, Česká republika: TECON Scientific, s.r.o., 2004, p. 146-150.

   More: https://is.muni.cz/publication/566428/en
3. Microstructural changes as postmortem temperature indicator in Ni-Co-Cr-Al-Y oxidation protection coatings

   BAUFELD, Bernd, Marion BARTSCH, Pavel BROŽ and Martin SCHMÜCKER. Microstructural changes as postmortem temperature indicator in Ni-Co-Cr-Al-Y oxidation protection coatings. Materials Science and Engineering A. Netherland, 2004, vol. 384, 1-2, p. 162-171. ISSN 0921-5093.

   More: https://is.muni.cz/publication/560509/en