Výpis publikací

2001

1. Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies

   ROCH, Tomáš, Mojmír MEDUŇA, Julian STANGL, Anke HESSE, Rainer T LECHNER, Guenther BAUER, G. DEHLINGER, L. DIEHL, U. GENNSER, Elisabeth MÜLLER a Detlev GRÜTZMACHER. Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies. Journal of Applied Physics. USA: American Institute of Physics, 2001, roč. 91, č. 11, s. 8974-8978. ISSN 0021-8979.

   Podrobněji: https://is.muni.cz/publication/753444/cs
2. X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy

   MEDUŇA, Mojmír, Václav HOLÝ a T. ROCH. X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy. Journal of Applied Physics. USA: American institute of physics, 2001, roč. 89, č. 9, s. 4836-4842. ISSN 0021-8979.

   Podrobněji: https://is.muni.cz/publication/385315/cs