Výpis publikací

HUMLÍČEK, Josef. In-situ spectroscopic ellipsometry: optimization of monitoring and closed-loop-control procedures. physica status solidi (a), Applied research. Berlin: Akademie-Verlag, 2008, roč. 205, č. 4, s. 793-796. ISSN 1862-6300.

EITZINGER, Christian, Jan FIKAR, Christian FORSICH a Josef HUMLÍČEK. Spectroscopic Ellipsometry as a Tool for On-Line Monitoring and Control of Surface Treatment Processes. Materials Science Forum. Trans Tech Publications, 2006, roč. 518, č. 4, s. 423-430. ISSN 0255-5476.