Masarykova univerzita

Výpis publikací

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Filtrování publikací

    2008

    1. MATYI, Richard J, Laura E. DEPERO, Elza BONTEMPI, Paolo COLOMBI, Alan GIBAUD, Matej JERGEL, Michael KRUMREY, Tamzin LAFFORD, Alessio LAMPERTI, Mojmír MEDUŇA, A. van der LEE a Claudia WIEMER. The international VAMAS project on X-ray reflectivity measurements for evaluation of thin films and multilayers - Preliminary results from the second round-robin. Thin Solid Films. Elsevier, 2008, roč. 516, č. 22, s. 7962-7966. ISSN 0040-6090.

    2007

    1. VALTR, Miroslav, Petr KLAPETEK, Ivan OHLÍDAL a Daniel FRANTA. UV light enhanced oxidation of a-C:H thin film in air: A study of thickness reduction. Optoelectronics and Advanced Materials - Rapid Communications. Bucharest: INOE & INFM, 2007, roč. 1, č. 11, s. 620-624. ISSN 1842-6573.

    2006

    1. MUSA, G., C.P. LUNGU, V. CIUPINA, Vilma BURŠÍKOVÁ a Rodica VLADOIU. Mechanical properties of the tungsten thin film deposited by thermionic vacuum arc (TVA) method. In Abstracts of Invited Lectures and Contributed Papers, 18th Europhysics Conference on Atomic and Molecular Physics of Ionized Gases. 1. vyd. Piacenza, Italy: European Physical Society, 2006, s. 503-504. ISBN 2-914771-38-X.
    2. VLADOIU, R., V. CIUPINA, C.P. LUNGU, Vilma BURŠÍKOVÁ a G. MUSA. Thermoionic vacuum arc (TVA) deposited tungsten thin film characterization. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2006, roč. 8, č. 1, s. 71-73. ISSN 1454-4164.
    3. SLÁDEK, Petr a Vilma BURŠÍKOVÁ. Thermomechanical Stability of the p-i-n Solar Cells Studied by Depth Sensing Indentation Technique. In XXIV. International Colloquium on the Acquisition Process Management. 1. vyd. Brno: Universita obrany, Fakulta ekonomiky a managementu, 2006, s. 51-56. ISBN 80-7231-139-5.

    2005

    1. BURŠÍKOVÁ, Vilma, Petr SLÁDEK, Pavel SŤAHEL a Jiří BURŠÍK. Complex study of the mechanical properties of a-Si:H and a-SiC:H thin films. In Book of abstract - ICANS 21. Lisbon: Universidade Nova de Lisboa, 2005, s. 162. ISBN 972-8893-04-3.

    2001

    1. POLOUČEK, Pavel, U. PIETSCH, T. GEUE, C. SYMIETZ a G. BREZESINSKI. X-ray reflectivity analysis of thin complex Langmuir-Blodgett films. Journal of physics D: Applied physics. Bristol, England: IOP Publishing Ltd., 2001, roč. 34, č. 4, s. 450-458. ISSN 0022-3727.
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