Výpis publikací

NÁDAŽDY, Peter, Jakub HAGARA, Matej JERGEL, Eva MAJKOVÁ, Petr MIKULÍK, Zdenko ZÁPRAŽNÝ, Dusan KORYTÁR a Peter ŠIFFALOVIČ. Exploiting the potential of beam-compressing channel-cut monochromators for laboratory high-resolution small-angle X-ray scattering experiments. Journal of Applied Crystallography. Chester: INT UNION CRYSTALLOGRAPHY, 2019, roč. 52, JUN 2019, s. 498-506. ISSN 0021-8898. Dostupné z: https://dx.doi.org/10.1107/S1600576719003674.

BANERJEE, Rupak, Jiří NOVÁK, Christian FRANK, Maria GIRLEANU, Olivier ERSEN, Martin BRINKMANN, Falk ANGER, Christian LORCH, Johannes DIETERLE, Alexander GERLACH, Jakub DRNEC, Sun YU a Frank SCHREIBER. Structure and Morphology of Organic Semiconductor-Nanoparticle Hybrids Prepared by Soft Deposition. JOURNAL OF PHYSICAL CHEMISTRY C. Washington D.C.: American Chemical Society, 2015, roč. 119, č. 9, s. 5225-5237. ISSN 1932-7447. Dostupné z: https://dx.doi.org/10.1021/acs.jpcc.5b00480.

FRANK, C., R. BANERJEE, M. OETTEL, A. GERLACH, Jiří NOVÁK, G. SANTORO a F. SCHREIBER. Analysis of island shape evolution from diffuse x-ray scattering of organic thin films and implications for growth. Physical Review B. College (USA): American Institute of Physics, 2014, roč. 90, č. 20, s. "205401", 10 s. ISSN 1098-0121. Dostupné z: https://dx.doi.org/10.1103/PhysRevB.90.205401.

FRANK, Christian, Jiří NOVÁK, Rupak BANERJEE, Alexander GERLACH, Frank SCHREIBER, Alexei VOROBIEV a Stefan KOWARIK. Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering. Physical Review B. Maryland (USA): The American Physical Society, 2014, roč. 90, č. 4, s. "045410-1"-"045410-6", 6 s. ISSN 1098-0121. Dostupné z: https://dx.doi.org/10.1103/PhysRevB.90.045410.

STANGL, J., Václav HOLÝ, Petr MIKULÍK, G. BAUER, I. KEGEL, T.H. METZGER, O.G. SCHMIDT, C. LANGE a K. EBERL. Self-assembled carbon-induced germanium quantum dots studied by grazing-incidence small-angle x-ray scattering. Applied Physics Letters. USA: American Institute of Physics, 1999, roč. 74, -, s. 3785-3787. ISSN 0003-6951.