Výpis publikací

BASSLER, Kevin E. a Ondřej CAHA. Nonlinear evolution of surface morphology in short-period superlattices. In Diffuse scattering and the fundamental properties of materials. 1. vyd. New Jersey (USA): Momentum press, 2009, s. 95-102. ISBN 978-1-60650-000-2.

MIKULÍK, Petr. X-ray reflectometry and diffuse scattering. 2007. vyd. Smolenice (Slovensko): 7th Autumn School on X-ray scattering from surfaces and thin layers, 2007. international workshop.

KLANG, Pavel, Václav HOLÝ, Josef KUBĚNA, Richard ŠTOUDEK a Jan ŠIK. X-ray diffuse scattering from defects in nitrogen-doped Czochralski grown silicon wafers. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2005, roč. 2005, č. 38, s. A105-A110, 6 s. ISSN 0022-3727.

KLANG, Pavel, Václav HOLÝ, Richard ŠTOUDEK a Jan ŠIK. X-ray Diffuse Scattering from Defects in Nitrogen-doped Czochralski Grown Silicon Wafers. In Proceedings of The Ninth Scientific and Business Conference SILICON 2004. 2004. vyd. Rožnov pod Radhoštěm, Česká republika: TECON Scientific, s.r.o., 2004, s. 53.