Výpis publikací

2004

1. Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation

   KLAPETEK, Petr, Ivan OHLÍDAL a Karel NAVRÁTIL. Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation. Microchimica Acta. Wien: Springer-Verlag, 2004, roč. 147, č. 3, s. 175-180. ISSN 0026-3672.

   Podrobněji: https://is.muni.cz/publication/562896/cs