Výpis publikací

2004

1. Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry

   FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK a Pere ROCA I CABARROCAS. Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry. Thin Solid Films. Oxford, UK: Elsevier science, 2004, roč. 455-456, č. 1, s. 399-403. ISSN 0040-6090.

   Podrobněji: https://is.muni.cz/publication/555840/cs