Výpis publikací

KLAPETEK, Petr, Ivan OHLÍDAL a Karel NAVRÁTIL. Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation. Microchimica Acta. Wien: Springer-Verlag, 2004, roč. 147, č. 3, s. 175-180. ISSN 0026-3672.

FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK a Miloslav OHLÍDAL. Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons., 2004, roč. 36, č. 8, s. 1203-1206. ISSN 0142-2421.

LI, J. H., J. KULIK a V. HOLY. X-ray diffraction from CuPt-ordered III-V ternary semiconductor alloy films. Phys. Rev. B. USA: The American Phys. Society, 2001, roč. 63, č. 15, s. 5310-5316. ISSN 0163-1829.

ADAM, Martin. Some Problems Concerning the Thematic and the Rhematic Layers in the Text. 2000. vyd. Brno: Faculty of Arts, Masaryk University, 2000, 65 s. An unpublished M.A. dissertation.