Publication Records

BASSLER, Kevin E. and Ondřej CAHA. Nonlinear evolution of surface morphology in short-period superlattices. In Diffuse scattering and the fundamental properties of materials. 1st ed. New Jersey (USA): Momentum press, 2009, p. 95-102. ISBN 978-1-60650-000-2.

MIKULÍK, Petr. X-ray reflectometry and diffuse scattering. 2007th ed. Smolenice (Slovensko): 7th Autumn School on X-ray scattering from surfaces and thin layers, 2007. international workshop.

KLANG, Pavel, Václav HOLÝ, Josef KUBĚNA, Richard ŠTOUDEK and Jan ŠIK. X-ray diffuse scattering from defects in nitrogen-doped Czochralski grown silicon wafers. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2005, vol. 2005, No 38, p. A105-A110, 6 pp. ISSN 0022-3727.

KLANG, Pavel, Václav HOLÝ, Richard ŠTOUDEK and Jan ŠIK. X-ray Diffuse Scattering from Defects in Nitrogen-doped Czochralski Grown Silicon Wafers. In Proceedings of The Ninth Scientific and Business Conference SILICON 2004. 2004th ed. Rožnov pod Radhoštěm, Česká republika: TECON Scientific, s.r.o., 2004, p. 53.