Publication Records

2017

1. Mid-infrared ellipsometry, Raman and X-ray diffraction studies of AlxGa1-xN/AlN/Si structures

   WANG, Chennan, Ondřej CAHA, Filip MÜNZ, Petr KOSTELNÍK, Tomáš NOVÁK and Josef HUMLÍČEK. Mid-infrared ellipsometry, Raman and X-ray diffraction studies of AlxGa1-xN/AlN/Si structures. Applied Surface Science. Amsterdam: Elsevier Science, 2017, vol. 421, November, p. 859-865. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2017.02.056.

   More: https://is.muni.cz/publication/1399383/en