Publication Records

BANERJEE, Rupak, Jiří NOVÁK, Christian FRANK, Maria GIRLEANU, Olivier ERSEN, Martin BRINKMANN, Falk ANGER, Christian LORCH, Johannes DIETERLE, Alexander GERLACH, Jakub DRNEC, Sun YU and Frank SCHREIBER. Structure and Morphology of Organic Semiconductor-Nanoparticle Hybrids Prepared by Soft Deposition. JOURNAL OF PHYSICAL CHEMISTRY C. Washington D.C.: American Chemical Society, 2015, vol. 119, No 9, p. 5225-5237. ISSN 1932-7447. Available from: https://dx.doi.org/10.1021/acs.jpcc.5b00480.

ZEMEK, Josef, Kamil OLEJNÍK and Petr KLAPETEK. Photoelectron spectroscopy from randomly corrugated surfaces. Surface science. Amsterdam: Elsevier, 2008, vol. 602, No 7, p. 1440-1446. ISSN 0039-6028.

CABÁLKOVÁ, Jana, Jan PŘIBYL, Petr SKLÁDAL, Pavel KULICH and Josef CHMELÍK. Size, shape and surface morphology of starch granules from Norway spruce needles revealed by transmission electron microscopy and atomic force microscopy: effects of elevated CO2 concentration. Tree Physiology. Victoria, Kanada: Heron Publishing, 2008, vol. 28, No 10, p. 1593-1599. ISSN 0829-318X.

DUŠEK, Jiří, Vilma BURŠÍKOVÁ, Vladislav NAVRÁTIL, Jiří BURŠÍK, Olga BLÁHOVÁ and Petr KLAPETEK. Comparative study on several micro and nanoindentation techniques including AFM. In NANO ´06. Brno: University of Technology, Faculty of Mechanical Engineering and COMTES FHT, Ltd., Plzeň, 2007, p. 30-30. ISBN 80-214-3331-0.

BURŠÍKOVÁ, Vilma, Olga BLÁHOVÁ, Lenka ZAJÍČKOVÁ, Marek ELIÁŠ, Ondřej JAŠEK, Monika KARÁSKOVÁ, A. BOUSQUET, Jiří BURŠÍK and Petr KLAPETEK. The instrumented indentation test - powerful tool in development of new materials. In LMV 2006 Možnosti aplikace výsledků měření. Plzeň: Západočeská univerzita v Plzni, 2007, p. 36-43. ISBN 80-7043-512-7.

FOJT, Lukáš, Luděk STRAŠÁK and Vladimír VETTERL. 50 Hz magnetic field effect on the morphology of bacteria. In BES 2007 Toulouse, Book of Abstracts. Toulouse: The Bioelectrochemical Society, 2007, p. 150.

SŤAHEL, Pavel, Vilma BURŠÍKOVÁ, Antonín BRABLEC, Zdeněk NAVRÁTIL, Martin ŠÍRA and Jan JANČA. Application of Surface Barrier Discharge for deposition of Protective Coatings and Plasma Activation of Surfaces. In 7th International Balkan Workshop on Applied Physics - Abstracts. 1st ed. Constanta, Romania: Ovidius University, 2006, p. 102-102. ISBN 978-973-614-314-4.

FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Růžena NEPUSTILOVÁ and Svatopluk BAJER. Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 2006, vol. 38, No 4, p. 842-846. ISSN 0142-2421.

BURŠÍKOVÁ, Vilma. The instrumented indentation test - powerful tool in development of new materials. In Lokální mechanické vlastnosti 2006. 2006.

VALTR, Miroslav, Ivan OHLÍDAL and Petr KLAPETEK. AFM Study of Hydrocarbon Thin Films. In WDS'05 Proceedings of Contributed Papers: Part II - Physics of Plasmas and Ionized Media (ed. J. Safrankova). Praha: Matfyzpress, 2005, p. 391-396. ISBN 80-86732-59-2.

KLAPETEK, Petr and Ivan OHLÍDAL. Application of the wavelet transformation in AFM data analysis. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2005, vol. 55, No 3, p. 295-303. ISSN 0323-0465.

KLAPETEK, Petr, Ivan OHLÍDAL and Jindřich BÍLEK. Atomic Force Microscope Tip Influence on the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough Surafaces. In Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro-and Nanometer Range. Weinheim 2005: Wiley-VCH Verlag GmbH and Co. KGaA, 2005, p. 452-462. ISBN 3-527-40502-X.

KLAPETEK, Petr, Ivan OHLÍDAL, Alberto MONTAIGNE RAMIL, Alberta BONNANNI and Helmut SITTER. Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD. Vacuum. USA: ELSEVIER (PERGAMON), 2005, vol. 80, 1-3, p. 53-57. ISSN 0042-207X.

OHLÍDAL, Ivan, Daniel FRANTA and Petr KLAPETEK. Combination of optical methods and atomic force microscopy at characterization of thin film systems. Acta physica slovaca. Bratislava: Institute of Physics, SAS, 2005, vol. 55, No 3, p. 271-294. ISSN 0323-0465.

OHLÍDAL, Ivan, Daniel FRANTA and Petr KLAPETEK. Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly (Measurement of nanoroughness using optical methods and atomic force microscopy). In Kvalita a GPS 2005. Brno: Subkomise metrologie při TNK 7, 2005, p. 131-139. ISBN 80-214-3033-8.

BURŠÍKOVÁ, Vilma, Petr KLAPETEK, Angelique BOUSQUET and Marek ELIÁŠ. Study of the mechanical properties of thin films using combined nanoindentation and AFM measurements. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2005, vol. 50, 11_12, p. 323-326. ISSN 0447-6441.

FIKAR, Jan, Christophe COUPEAU, Tomáš KRUML and Joel BONNEVILLE. Experimental study of Ni3Al slip traces by atomic force microscopy: an evidence of mobile dislocation exhaustion. Materials Science and Engineering A. Netherland, 2004, 387-389, No 1, p. 926-930. ISSN 0921-5093.

KLAPETEK, Petr, Ivan OHLÍDAL and Jindřich BÍLEK. Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces. Ultramicroscopy. Amsterdam: Elsevier, 2004, vol. 102, No 1, p. 51-59. ISSN 0304-3991.

OHLÍDAL, Ivan, Petr KLAPETEK and Daniel FRANTA. Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe (Application of Atomic Force Microscopy for Analysis of ZnSe and ZnTe Thin Films). Československý časopis pro fyziku. Praha: Fyzikální ústav AV ČR, 2003, vol. 53, No 2, p. 97-100. ISSN 0009-0700.

ŠILER, Martin, Ivan OHLÍDAL and Petr KLAPETEK. Mikroskopie magnetické síly: Aplikace při studiu pevných disků (Magnetic Force Microscopy: Application at study of hard disks). Československý časopis pro fyziku. Praha: Fyzikální ústav AV ČR, 2003, vol. 53, No 2, p. 124-127. ISSN 0009-0700.

KLAPETEK, Petr and Ivan OHLÍDAL. Srovnání snímků NSOM a AFM při studiu vybraných objektů (Comparison of NSOM and AFM images of chosen samples). Československý časopis pro fyziku. Praha: Fyzikální ústav AV ČR, 2003, vol. 47, 6-7s, p. 79-81. ISSN 0009-0700.

KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA and Pavel POKORNÝ. Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, vol. 34, No 1, p. 559-564. ISSN 0142-2421.

FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK and Pavel POKORNÝ. Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, vol. 34, No 1, p. 759-762. ISSN 0142-2421.

FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Pavel POKORNÝ and Miloslav OHLÍDAL. Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 2001, vol. 32, No 1, p. 91-94. ISSN 0142-2421.

BURŠÍKOVÁ, Vilma and Vladislav NAVRÁTIL. Determination of Mechanical Properties of Thin Films by the Indentation Techniques. In New Trends in Physics. I. Brno: VUT Brno, Fakulta Elektrotechniky a Informatiky, 2001, p. 333-338. ISBN 80-214-1992-X.

KLAPETEK, Petr, Daniel FRANTA and Ivan OHLÍDAL. Study of Thin Film Defects by Atomic Force Microscopy. In Proceedings of the 4th Seminar on Quantitative Microscopy and 1st Seminar on Nanoscale Calibration Standards and Methods. Braunschweig: Physikalisch-Technische Bundesanstalt, 2001, p. 107-117. ISBN 3-89701-840-3.

MEDUŇA, Mojmír, Václav HOLÝ, Josef KUBĚNA, Julian STANGL, Gunter BAUER, Jian-hong ZHU and Karl BRUNNER. RTG reflexe laterálních struktur SiGe (X-ray reflection on lateral structures SiGe). In 13. konference slovenských a českých fyzikov. Zvolen: Slovenská fyzikálna spoločnosť, 2000, p. 237-239. ISBN 80-228-0876-8.