Masaryk University

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    2001

    1. Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings
      MIKULÍK, Petr, M. JERGEL, T. BAUMBACH, E. MAJKOVÁ, E. PINČÍK, Š. LUBY, L. ORTEGA, R. TUCOULOU, P. HUDEK and I. KOSTIČ. Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2001, vol. 34, 10A, p. A188, 5 pp. ISSN 0022-3727.
      More: https://is.muni.cz/publication/362931/en
    2. X-ray reflectivity study of a W/Si multilayer grating
      JERGEL, M., C. FALCONY, Petr MIKULÍK, L. ORTEGA, E. MAJKOVÁ, E. PINČÍK, Š. LUBY, I. KOSTIČ and P. HUDEK. X-ray reflectivity study of a W/Si multilayer grating. Superficies y Vacío. Mexico: Sociedad Mexicana de Ciencia de Superfic, 2001, vol. 2001, No 13, p. 10-14. ISSN 1665-3521.
      More: https://is.muni.cz/publication/407469/en

    2000

    1. Multilayer gratings for X-UV optics
      JERGEL, M., Petr MIKULÍK, E. MAJKOVÁ, E. PINČÍK, Š. LUBY, M. BRUNEL, P. HUDEK and I. KOSTIČ. Multilayer gratings for X-UV optics. Acta physica slovaca. Bratislava: Institute of Physics, SAS, 2000, vol. 50, No 4, p. 427-864. ISSN 0323-0465.
      More: https://is.muni.cz/publication/327331/en
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