Masaryk University

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    2008

    1. The international VAMAS project on X-ray reflectivity measurements for evaluation of thin films and multilayers - Preliminary results from the second round-robin
      MATYI, Richard J, Laura E. DEPERO, Elza BONTEMPI, Paolo COLOMBI, Alan GIBAUD, Matej JERGEL, Michael KRUMREY, Tamzin LAFFORD, Alessio LAMPERTI, Mojmír MEDUŇA, A. van der LEE and Claudia WIEMER. The international VAMAS project on X-ray reflectivity measurements for evaluation of thin films and multilayers - Preliminary results from the second round-robin. Thin Solid Films. Elsevier, 2008, vol. 516, No 22, p. 7962-7966. ISSN 0040-6090.
      More: https://is.muni.cz/publication/819700/en

    2004

    1. X-ray reflection study of early stages of Pt silicide formation
      BOCHNÍČEK, Zdeněk, Jan ČECHAL and Tomáš ŠIKOLA. X-ray reflection study of early stages of Pt silicide formation. In 7th Bienal Conference on High Resolution X-ray Diffraction and Imaging, Book of abstracts. Praha: Fyzikální ústav AV ČR, 2004, p. P7, 1 pp.
      More: https://is.muni.cz/publication/634264/en

    2001

    1. Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings
      MIKULÍK, Petr, M. JERGEL, T. BAUMBACH, E. MAJKOVÁ, E. PINČÍK, Š. LUBY, L. ORTEGA, R. TUCOULOU, P. HUDEK and I. KOSTIČ. Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2001, vol. 34, 10A, p. A188, 5 pp. ISSN 0022-3727.
      More: https://is.muni.cz/publication/362931/en
    2. X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires
      ULYANENKOV, A., K. INABA, Petr MIKULÍK, N. DAROWSKI, K. OMOTE, J. GRENZER and A. FORCHEL. X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2001, vol. 34, 10A, p. A179, 4 pp. ISSN 0022-3727.
      More: https://is.muni.cz/publication/362932/en
    3. X-ray reflectivity analysis of thin complex Langmuir-Blodgett films
      POLOUČEK, Pavel, U. PIETSCH, T. GEUE, C. SYMIETZ and G. BREZESINSKI. X-ray reflectivity analysis of thin complex Langmuir-Blodgett films. Journal of physics D: Applied physics. Bristol, England: IOP Publishing Ltd., 2001, vol. 34, No 4, p. 450-458. ISSN 0022-3727.
      More: https://is.muni.cz/publication/630745/en
    4. X-ray reflectivity study of a W/Si multilayer grating
      JERGEL, M., C. FALCONY, Petr MIKULÍK, L. ORTEGA, E. MAJKOVÁ, E. PINČÍK, Š. LUBY, I. KOSTIČ and P. HUDEK. X-ray reflectivity study of a W/Si multilayer grating. Superficies y Vacío. Mexico: Sociedad Mexicana de Ciencia de Superfic, 2001, vol. 2001, No 13, p. 10-14. ISSN 1665-3521.
      More: https://is.muni.cz/publication/407469/en

    2000

    1. Multilayer gratings for X-UV optics
      JERGEL, M., Petr MIKULÍK, E. MAJKOVÁ, E. PINČÍK, Š. LUBY, M. BRUNEL, P. HUDEK and I. KOSTIČ. Multilayer gratings for X-UV optics. Acta physica slovaca. Bratislava: Institute of Physics, SAS, 2000, vol. 50, No 4, p. 427-864. ISSN 0323-0465.
      More: https://is.muni.cz/publication/327331/en
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