Masaryk University

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    2008

    1. Temperature dependence of ellipsometric spectra of Fe and CrNiAl steel
      NEBOJSA, Alois, Olga FIKAROVÁ ZRZAVECKÁ, Karel NAVRÁTIL and Josef HUMLÍČEK. Temperature dependence of ellipsometric spectra of Fe and CrNiAl steel. physica status solidi (c). 2008, vol. 5, No 5, p. 1176-1179. ISSN 1610-1642.
      Name in Czech: Teplotní závislost elipsometrických spekter Fe a CrNiAl oceli
      RIV/00216224:14310/08:00027154 Article in a journal. Solid-state physics and magnetism. English. Germany.
      Nebojsa, Alois (203 Czech Republic, guarantor) -- Fikarová Zrzavecká, Olga (203 Czech Republic) -- Navrátil, Karel (203 Czech Republic) -- Humlíček, Josef (203 Czech Republic)
      Keywords in English: spectroscopic ellipsometry; iron; CrNiAl steel; temperature dependence
      International impact: yes
      Reviewed: yes
      Changed by: prof. RNDr. Josef Humlíček, CSc., učo 307. Changed: 9/4/2010 15:46.
      More: https://is.muni.cz/publication/806291/en

    2006

    1. Spectroscopic Ellipsometry as a Tool for On-Line Monitoring and Control of Surface Treatment Processes
      EITZINGER, Christian, Jan FIKAR, Christian FORSICH and Josef HUMLÍČEK. Spectroscopic Ellipsometry as a Tool for On-Line Monitoring and Control of Surface Treatment Processes. Materials Science Forum. Trans Tech Publications, 2006, vol. 518, No 4, p. 423-430. ISSN 0255-5476.
      Name in Czech: Spektroskopická elipsometrie jako nástroj pro on-line monitorování a řízení povrchových procesů
      RIV/00216224:14310/06:00016820 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Eitzinger, Christian (40 Austria) -- Fikar, Jan (203 Czech Republic) -- Forsich, Christian (40 Austria) -- Humlíček, Josef (203 Czech Republic, guarantor)
      Keywords in English: surface treatment; spectroscopic ellipsometry; on-line monitor; closed loop control; nitriding
      Changed by: prof. RNDr. Josef Humlíček, CSc., učo 307. Changed: 10/5/2006 13:36.
      More: https://is.muni.cz/publication/634785/en

    2005

    1. Spectroscopic ellipsometry on lamellar gratings
      ANTOŠ, Roman, Ivan OHLÍDAL, Jan MISTRÍK, K. MURAKAMI, Tomuo YAMAGUCHI, J. PIŠTORA, M. HORIE and Štefan VIŠŇOVSKÝ. Spectroscopic ellipsometry on lamellar gratings. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 225-229. ISSN 0169-4332.
      Name in Czech: Spektroskopická elipsometrie na lamelárních mřížkách
      RIV/00216224:14310/05:00013300 Article in a journal. Optics, masers and lasers. English. United States of America.
      Antoš, Roman (203 Czech Republic) -- Ohlídal, Ivan (203 Czech Republic, guarantor) -- Mistrík, Jan (203 Czech Republic) -- Murakami, K. (392 Japan) -- Yamaguchi, Tomuo (392 Japan) -- Pištora, J. (203 Czech Republic) -- Horie, M. (392 Japan) -- Višňovský, Štefan (203 Czech Republic)
      Keywords in English: optical metrology; scatterometry; spectroscopic ellipsometry; diffraction grating; wood anomaly; RCWA
      Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 28/2/2006 19:25.
      More: https://is.muni.cz/publication/630341/en

    2004

    1. In situ analysis of PMPSi by spectroscopic ellipsometry and XPS
      ČECHAL, Jan, Petr TICHOPÁDEK, Alois NEBOJSA, Olga BONAVENTUROVÁ ZRZAVECKÁ, Michal URBÁNEK, Jiří SPOUSTA, Karel NAVRÁTIL and Tomáš ŠIKOLA. In situ analysis of PMPSi by spectroscopic ellipsometry and XPS. Surface and Interface Analysis. USA: John Wiley & Sons, 2004, vol. 2004, No 36, p. 1218-1221. ISSN 0142-2421.
      Name in Czech: Analýza PMPSi metodou spektroskopické elipsometrie a XPS
      Name (in English): In situ analysis of PMPSi by spectroscopic ellipsometry and XPS
      RIV/00216224:14310/04:00010399 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Čechal, Jan (203 Czech Republic) -- Tichopádek, Petr (203 Czech Republic) -- Nebojsa, Alois (203 Czech Republic) -- Bonaventurová Zrzavecká, Olga (203 Czech Republic, guarantor) -- Urbánek, Michal (203 Czech Republic) -- Spousta, Jiří (203 Czech Republic) -- Navrátil, Karel (203 Czech Republic) -- Šikola, Tomáš (203 Czech Republic)
      Keywords in English: spectroscopic ellipsometry; x-ray photoelectron spectroscopy; XPS; polysilanes; PMPSi
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Olga Fikarová Zrzavecká, učo 11887. Changed: 4/1/2009 10:30.
      More: https://is.muni.cz/publication/559741/en
    2. In situ analysis of PMPSi thin films by spectroscopic ellipsometry
      BRANDEJSOVÁ, Eva, Jan ČECHAL, Olga BONAVENTUROVÁ ZRZAVECKÁ, Alois NEBOJSA, Petr TICHOPÁDEK, Michal URBÁNEK, Karel NAVRÁTIL, Tomáš ŠIKOLA and Josef HUMLÍČEK. In situ analysis of PMPSi thin films by spectroscopic ellipsometry. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2004, 9/2004, No 9, p. 260-262. ISSN 0447-6441.
      Name in Czech: In situ analýza tenkých vrstev PMPSi metodou spektroskopické elipsometrie
      Name (in English): In situ analysis of PMPSi thin films by spectroscopic ellipsometry
      RIV/00216224:14310/04:00010983 Article in a journal. Solid-state physics and magnetism. English. Czech Republic.
      Brandejsová, Eva (203 Czech Republic) -- Čechal, Jan (203 Czech Republic) -- Bonaventurová Zrzavecká, Olga (203 Czech Republic) -- Nebojsa, Alois (203 Czech Republic) -- Tichopádek, Petr (203 Czech Republic) -- Urbánek, Michal (203 Czech Republic) -- Navrátil, Karel (203 Czech Republic) -- Šikola, Tomáš (203 Czech Republic) -- Humlíček, Josef (203 Czech Republic, guarantor)
      Keywords in English: spectroscopic ellipsometry; poly(methyl-phenylsilane)
      Changed by: prof. RNDr. Josef Humlíček, CSc., učo 307. Changed: 9/2/2007 14:26.
      More: https://is.muni.cz/publication/566971/en
    3. Proximity induced metal-insulator transition in YBa2Cu3O7/La2/3Ca1/3MnO3 superlattices
      HOLDEN, Todd, Hanns HABERMEIER, Georg CRISTIANI, Andrzej GOLNIK, Alexander BORIS, Alexei PIMENOV and Josef HUMLÍČEK. Proximity induced metal-insulator transition in YBa2Cu3O7/La2/3Ca1/3MnO3 superlattices. Physical Review B. USA: The American Physical Society, 2004, vol. 69, No 6, p. 4505 1-7, 7 pp. ISSN 1098-0121.
      Name in Czech: Přechod kov-izolátor v supermřížkách YBa2Cu3O7/La2/3Ca1/3MnO3
      Name (in English): Proximity induced metal-insulator transition in YBa2Cu3O7/La2/3Ca1/3MnO3 superlattices
      RIV/00216224:14310/04:00021198 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Holden, Todd (840 United States of America) -- Habermeier, Hanns (276 Germany) -- Cristiani, Georg (276 Germany) -- Golnik, Andrzej (616 Poland) -- Boris, Alexander (643 Russian Federation) -- Pimenov, Alexei (616 Poland) -- Humlíček, Josef (203 Czech Republic, guarantor)
      Keywords in English: SPECTROSCOPIC ELLIPSOMETRY; SYNCHROTRON-RADIATION; ANISOTROPIC MEDIA; SUPERCONDUCTIVITY; MAGNETORESISTANCE; HETEROSTRUCTURES; FERROMAGNETISM; RUSR2GDCU2O8; COEXISTENCE; MAGNETISM
      International impact: yes
      Reviewed: yes
      Changed by: prof. RNDr. Josef Humlíček, CSc., učo 307. Changed: 9/4/2010 15:01.
      More: https://is.muni.cz/publication/553803/en

    2003

    1. Optical constants of ZnTe and ZnSe epitaxial thin films
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical constants of ZnTe and ZnSe epitaxial thin films. Acta Physica Slovaca. Bratislava: Institute of Physics SAS, 2003, vol. 53, No 2, p. 95-104. ISSN 0323-0465.
      URL
      RIV/00216224:14310/03:00008102 Article in a journal. Solid-state physics and magnetism. English. Slovakia.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Montaigne-Ramil, Alberto (192 Cuba) -- Bonanni, Alberta (380 Italy) -- Stifter, David (40 Austria) -- Sitter, Helmut (40 Austria)
      Keywords in English: SPECTROSCOPIC ELLIPSOMETRY; MATRIX FORMALISM; CARBON-FILMS; MULTISAMPLE; GAAS
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 01:24.
      More: https://is.muni.cz/publication/487588/en

    2002

    1. Influence of overlayers on determination of the optical constants of ZnSe thin films
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Influence of overlayers on determination of the optical constants of ZnSe thin films. Journal of Applied Physics. USA: American institute of physics, 2002, vol. 92, No 4, p. 1873-1880. ISSN 0021-8979.
      URL
      RIV/00216224:14310/02:00008572 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic) -- Montaigne-Ramil, Alberto (192 Cuba) -- Bonanni, Alberta (380 Italy) -- Stifter, David (40 Austria) -- Sitter, Helmut (40 Austria)
      Keywords in English: SPECTROSCOPIC ELLIPSOMETRY; GAAS; MULTISAMPLE; OXIDE
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 25/12/2003 01:07.
      More: https://is.muni.cz/publication/407666/en

    2000

    1. Analysis of Slightly Rough Thin Films by Optical Methods and AFM
      FRANTA, Daniel, Ivan OHLÍDAL and Petr KLAPETEK. Analysis of Slightly Rough Thin Films by Optical Methods and AFM. Mikrochim. Acta. Wien: Springer-Verlag, 2000, vol. 132, No 1, p. 443-447. ISSN 0026-3672.
      URL
      RIV/00216224:14310/00:00002233 Article in a journal. Solid-state physics and magnetism. English. Austria.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic) -- Klapetek, Petr (203 Czech Republic)
      Keywords in English: Spectroscopic Ellipsometry; Spectroscopic Reflectometry; Atomic Force Microscopy; Rough Thin Films
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 22/12/2003 00:23.
      More: https://is.muni.cz/publication/313891/en
    2. Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry
      FRANTA, Daniel and Ivan OHLÍDAL. Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry. Surface and Interface Analysis. USA: John Wiley & Sons, 2000, vol. 30, No 1, p. 574-579. ISSN 0142-2421.
      URL
      RIV/00216224:14310/00:00002371 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Franta, Daniel (203 Czech Republic, guarantor) -- Ohlídal, Ivan (203 Czech Republic)
      Keywords in English: Inhomogeneous ZrO2-films; Optical characterization; Spectroscopic ellipsometry; Spectroscopic reflectometry
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 22/12/2003 00:49.
      More: https://is.muni.cz/publication/334911/en

    1999

    1. Complete Optical Characterization of the SiO2/Si System by Spectroscopic Ellipsometry Spectroscopic Reflectometry and Atomic Force Microscopy
      OHLÍDAL, Ivan, Daniel FRANTA, Emil PINČÍK and Miloslav OHLÍDAL. Complete Optical Characterization of the SiO2/Si System by Spectroscopic Ellipsometry Spectroscopic Reflectometry and Atomic Force Microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 1999, vol. 28, No 1, p. 240-244. ISSN 0142-2421.
      URL
      RIV/00216224:14310/99:00002109 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic)
      Keywords in English: Optical constants of Si and SiO2; Spectrosopic reflectometry; Spectroscopic ellipsometry
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 21/12/2003 23:28.
      More: https://is.muni.cz/publication/208731/en

    1998

    1. Analysis of thin films with slightly rough boundaries
      OHLÍDAL, Ivan, Daniel FRANTA, Jaroslav HORA, Karel NAVRÁTIL, Jan WEBER and Pavel JANDA. Analysis of thin films with slightly rough boundaries. Mikrochim. Acta. Wien: Springer-Verlag, 1998, Suppl. 15, No 1, p. 177-180. ISSN 0026-3672.
      URL
      RIV/00216224:14310/98:00003184 Article in a journal. Solid-state physics and magnetism. English. Germany.
      Ohlídal, Ivan (203 Czech Republic, guarantor) -- Franta, Daniel (203 Czech Republic) -- Hora, Jaroslav (203 Czech Republic) -- Navrátil, Karel (203 Czech Republic)
      Keywords in English: Spectroscopic Ellipsometry; Spectroscopic Reflectometry; Atomic Force Microscopy
      Changed by: Mgr. Daniel Franta, Ph.D., učo 2000. Changed: 19/12/2003 19:25.
      More: https://is.muni.cz/publication/200406/en
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