Publication Records

NEBOJSA, Alois, Olga FIKAROVÁ ZRZAVECKÁ, Karel NAVRÁTIL and Josef HUMLÍČEK. Temperature dependence of ellipsometric spectra of Fe and CrNiAl steel. physica status solidi (c). 2008, vol. 5, No 5, p. 1176-1179. ISSN 1610-1642.

EITZINGER, Christian, Jan FIKAR, Christian FORSICH and Josef HUMLÍČEK. Spectroscopic Ellipsometry as a Tool for On-Line Monitoring and Control of Surface Treatment Processes. Materials Science Forum. Trans Tech Publications, 2006, vol. 518, No 4, p. 423-430. ISSN 0255-5476.

ANTOŠ, Roman, Ivan OHLÍDAL, Jan MISTRÍK, K. MURAKAMI, Tomuo YAMAGUCHI, J. PIŠTORA, M. HORIE and Štefan VIŠŇOVSKÝ. Spectroscopic ellipsometry on lamellar gratings. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 225-229. ISSN 0169-4332.

ČECHAL, Jan, Petr TICHOPÁDEK, Alois NEBOJSA, Olga BONAVENTUROVÁ ZRZAVECKÁ, Michal URBÁNEK, Jiří SPOUSTA, Karel NAVRÁTIL and Tomáš ŠIKOLA. In situ analysis of PMPSi by spectroscopic ellipsometry and XPS. Surface and Interface Analysis. USA: John Wiley & Sons, 2004, vol. 2004, No 36, p. 1218-1221. ISSN 0142-2421.

BRANDEJSOVÁ, Eva, Jan ČECHAL, Olga BONAVENTUROVÁ ZRZAVECKÁ, Alois NEBOJSA, Petr TICHOPÁDEK, Michal URBÁNEK, Karel NAVRÁTIL, Tomáš ŠIKOLA and Josef HUMLÍČEK. In situ analysis of PMPSi thin films by spectroscopic ellipsometry. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2004, 9/2004, No 9, p. 260-262. ISSN 0447-6441.

HOLDEN, Todd, Hanns HABERMEIER, Georg CRISTIANI, Andrzej GOLNIK, Alexander BORIS, Alexei PIMENOV and Josef HUMLÍČEK. Proximity induced metal-insulator transition in YBa2Cu3O7/La2/3Ca1/3MnO3 superlattices. Physical Review B. USA: The American Physical Society, 2004, vol. 69, No 6, p. 4505 1-7, 7 pp. ISSN 1098-0121.

FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical constants of ZnTe and ZnSe epitaxial thin films. Acta Physica Slovaca. Bratislava: Institute of Physics SAS, 2003, vol. 53, No 2, p. 95-104. ISSN 0323-0465.

FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Influence of overlayers on determination of the optical constants of ZnSe thin films. Journal of Applied Physics. USA: American institute of physics, 2002, vol. 92, No 4, p. 1873-1880. ISSN 0021-8979.

FRANTA, Daniel, Ivan OHLÍDAL and Petr KLAPETEK. Analysis of Slightly Rough Thin Films by Optical Methods and AFM. Mikrochim. Acta. Wien: Springer-Verlag, 2000, vol. 132, No 1, p. 443-447. ISSN 0026-3672.

FRANTA, Daniel and Ivan OHLÍDAL. Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry. Surface and Interface Analysis. USA: John Wiley & Sons, 2000, vol. 30, No 1, p. 574-579. ISSN 0142-2421.

OHLÍDAL, Ivan, Daniel FRANTA, Emil PINČÍK and Miloslav OHLÍDAL. Complete Optical Characterization of the SiO2/Si System by Spectroscopic Ellipsometry Spectroscopic Reflectometry and Atomic Force Microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 1999, vol. 28, No 1, p. 240-244. ISSN 0142-2421.

OHLÍDAL, Ivan, Daniel FRANTA, Jaroslav HORA, Karel NAVRÁTIL, Jan WEBER and Pavel JANDA. Analysis of thin films with slightly rough boundaries. Mikrochim. Acta. Wien: Springer-Verlag, 1998, Suppl. 15, No 1, p. 177-180. ISSN 0026-3672.