Publication Records

BOCHNÍČEK, Zdeněk. An amateur video camera as a detector of infrared radiation. Physics Education. Bristol, United Kingdom: IOP Publishing, 2008, vol. 43, No 1, p. 51-56. ISSN 0031-9120.

CAHA, Ondřej, Josef KUBĚNA, Alan KUBĚNA and Mojmír MEDUŇA. Kinetics of oxygen, vacancies and self-interstitials in silicon wafers. In Silicon 2008 - 11th Scientific and Business Conference. Rožnov p. Radhoštěm: TECON Scientific, s.r.o., 2008, p. 351--351. ISBN 978-80-254-3278-5.

MEDUŇA, Mojmír, Ondřej CAHA, Josef KUBĚNA and Alan KUBĚNA. Oxygen precipitation during two-stage annealing of Cz-Si. In Silicon 2008 - 11th Scientific and Business Conference. Rožnov p. Radhoštěm: TECON Scientific, s.r.o., 2008, p. 353. ISBN 978-80-254-3278-5.

CAHA, Ondřej, Josef KUBĚNA, Alan KUBĚNA, Mojmír MEDUŇA and Petr MIKULÍK. Study of oxygen precipitates in silicon using Bragg and Laue x-ray diffraction. In XTOP 2008 - 9th biennial conference on high-resolution x-ray diffraction and imaging. 2008.

CAHA, Ondřej. Study of oxygen precipitates in silicon using x-ray diffraction techniques. In Silicon 2008 - 11th Scientific and Business Conference. 2008. ISBN 978-80-254-3278-5.

BURSIKOVA, Vilma, Pavel STAHEL, Jaroslav SOBOTA, Jan GROSSMAN, Tomas FORT, Zdenek BOCHNICEK, Petr KLAPETEK, Jiri BURSIK and Vratislav PERINA. Study of thermal stability of Silicon, Oxygen and/or Nitrogen containing Diamon-like Carbon coatings. In 2nd conference on New Diamond and Nano Carbons 2008. 2008.

KUBĚNA, Josef, Alan KUBĚNA, Ondřej CAHA and Petr MIKULÍK. Development of oxide precipitates in silicon: calculation of the distribution function of the classical theory of nucleation by a nodal-points approximation. J. Phys. Condens. Matter. IOP Publishing Ltd, 2007, vol. 19, No 49, p. 496202-496212. ISSN 0953-8984.

HOUSEROVÁ, Jana. Si-containing Laves phases. In Pracovní setkání fyzikálních chemiků a elektrochemiků /7./. 1st ed. Brno: Masarykova univerzita, 2007, p. 65-66. ISBN 978-80-21042353.

DUŠEK, Jiří, Vilma BURŠÍKOVÁ, Jaroslav SOBOTA, Jiří BURŠÍK, Olga BLÁHOVÁ, Petr KLAPETEK, Rodica VLADOIU and Vladislav NAVRÁTIL. Study of Mechanical Properties of Metallic Surface Layers on Silicon Substrates. In NANO 07. 2007. ISBN 978-80-214-3460-8.

BURŠÍKOVÁ, Vilma, Lenka ZAJÍČKOVÁ, Pavel DVOŘÁK, Miroslav VALTR, Jiří BURŠÍK, Olga BLÁHOVÁ, Vratislav PEŘINA and Jan JANČA. Influence of Silicon, Oxygen and Nitrogen Upon the Properties of Plasma Deposited Amorphous Diamond-like Carbon Coatings. Journal of advanced oxidation technologies. Dundas, Ontario, Canada: Science & Technology Network, Inc., 2006, vol. 9, No 2, p. 232-237, 5 pp. ISSN 1203-8407.

ŠTOUDEK, Richard and Josef HUMLÍČEK. Infrared spectroscopy of oxygen interstitials and precipitates in nitrogen-doped silicon. Physica B condensed matter. Amsterdam: Elsevier Science, 2006, 376-377, No 6, p. 150-153. ISSN 0921-4526.

BURŠÍKOVÁ, Vilma, Petr SLÁDEK, Pavel SŤAHEL and Jiří BURŠÍK. Mechanical properties of thin silicon films deposited on glass and plastic substrates studied by depth sensing indentation technique. Journal of Non-Crystalline Solids. Nizozemsko: Elsevier Science B.V., 2006, vol. 352, 9-20, p. 1242-1245. ISSN 0022-3093.

ŠTOUDEK, Richard, Pavel KLANG, Alan KUBĚNA and Josef KUBĚNA. Nucleation and Precipitation of Interstitial Oxygen in Czochralski Silicon. In Proceedings of The Tenth Scientific and Business Conference SILICON 2006. Rožnov pod Radhoštěm, Česká republika: TECON Scientific, s.r.o., 2006, p. 283-284. ISBN 80-239-7781-4.

KLANG, Pavel, Václav HOLÝ, Josef KUBĚNA, Richard ŠTOUDEK and Jan ŠIK. X-ray diffuse scattering from defects in nitrogen-doped Czochralski grown silicon wafers. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2005, vol. 2005, No 38, p. A105-A110, 6 pp. ISSN 0022-3727.

ŠTOUDEK, Richard and Josef HUMLÍČEK. Infrared Absorption Spectroscopy of Oxygen Precipitates in Czochralski Silicon. In WDS'04 Proceedings of Contributed Papers. Praha, Česká republika: MATFYZPRESS, 2004, p. 475-479, 4 pp. ISBN 80-86732-32-0.

ŠTOUDEK, Richard, Michal LORENC and Josef HUMLÍČEK. Infrared Absorption Spectroscopy of Oxygen Precipitates in Nitrogen-doped Czochralski Silicon. In Proceedings of The Ninth Scientific and Business Conference SILICON 2004. Rožnov pod Radhoštěm, Česká republika: TECON Scientific, s.r.o., 2004, p. 146-150.

MIKULÍK, Petr. Project of a clean room laboratory for silicon device technology at the Masaryk University. In Proceedings of International Conference Silicon-2004. Rožnov pod Radhoštěm: Karel Vojtěchovský, 2004, p. 54-55.

KLANG, Pavel, Václav HOLÝ, Richard ŠTOUDEK and Jan ŠIK. X-ray Diffuse Scattering from Defects in Nitrogen-doped Czochralski Grown Silicon Wafers. In Proceedings of The Ninth Scientific and Business Conference SILICON 2004. 2004th ed. Rožnov pod Radhoštěm, Česká republika: TECON Scientific, s.r.o., 2004, p. 53.

FRANTA, Daniel, Ivan OHLÍDAL, Vilma BURŠÍKOVÁ and Lenka ZAJÍČKOVÁ. Optical properties of diamond-like carbon films containing SiOx. Diamond and Related Materials. Amsterdam: Elsevier, 2003, vol. 12, No 9, p. 1532-1538. ISSN 0925-9635.

MIKULÍK, Petr, T. BAUMBACH, D. KORYTÁR, P. PERNOT, D. LÜBBERT, L. HELFEN and Ch. LANDESBERGER. Advanced X-ray diffraction imaging techniques for semiconductor wafer characterisation. Materials Structure. Praha: The Czech and Slovak Cryst. Assoc., 2002, vol. 9, No 2, p. 87-88. ISSN 1211-5894.

ŠIK, Jan, Michal LORENC and Richard ŠTOUDEK. Nitrogen in Czochralski-grown silicon. In SILICON 2002, Rožnov pod Radhostěm, TECON Scientific, editor K. Vojtěchovský. Neuveden: Neuveden, 2002, p. 125-128.

OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL and Karel NAVRÁTIL. Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances. Applied Optics. USA: Optical Society of America, 2001, vol. 40, No 31, p. 5711-5717. ISSN 0003-6935.

SŤAHEL, Pavel, Petr SLÁDEK and Pere ROCA I CABARROCAS. Fotovoltaická konverze - solární články vyrobené z křemíku (Photovoltaic conversion - silicon solar cells). In Fyzika, životní prostředí, energie a škola. 1st ed. Brno: Masarykova univerzita Brno, 1999.

ŠIK, Jan, Jaroslav HORA and Josef HUMLÍČEK. Optical functions of silicon at high temperatures. Journal of Applied Physics. USA: American institute of physics, 1998, vol. 1998, No 11, p. 6291-6298. ISSN 0021-8979.