Publication Records

ZEMEK, Josef, Kamil OLEJNÍK and Petr KLAPETEK. Photoelectron spectroscopy from randomly corrugated surfaces. Surface science. Amsterdam: Elsevier, 2008, vol. 602, No 7, p. 1440-1446. ISSN 0039-6028.

HASOŇ, Stanislav, František JELEN, Lukáš FOJT and Vladimír VETTERL. Determination of picogram quantities of oligodeoxynucleotides by stripping voltammetry at mercury modified graphite electrode surfaces. J.Electroanal.Chem. The Netherlands: Elsevier, The Netherlands, 2005, vol. 577, No 3, p. 263-272. ISSN 0022-0728.

OHLÍDAL, Miloslav, L. ŠÍR, M. JÁKL and Ivan OHLÍDAL. Digital two-wavelength holographic interference microscopy for surface roughness measurement. In Proceedings of SPIE 5945, 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005, p. 59450I-1-59450I-8, 8 pp. ISBN 0-8194-5958-8.

OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA and Miroslav TYKAL. Comparison of optical and non-optical methods for measuring surface roughness. In Proceedings of SPIE 3820, 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, p. 456-467. ISBN 0-8194-3306-3.