česky | in English
Name (in English): Laser desorption time-of-flight mass spectrometry of atomic switch memory Ge2Sb2Te5 bulk materials and its thin films
RIV/00216224:14310/14:00073479 Article in a journal. Analytical chemistry, separation. English. United States of America.
Houška, Jan (203 Czech Republic, belonging to the institution) -- Peña-Méndez, Eladia Maria (724 Spain) -- Kolář, Jakub (203 Czech Republic) -- Přikryl, Jan (203 Czech Republic) -- Pvlišta, Martin (203 Czech Republic) -- Frumar, Miloslav (203 Czech Republic) -- Wágner, Tomáš (203 Czech Republic) -- Havel, Josef (203 Czech Republic, guarantor, belonging to the institution)
Keywords in English: atomic switch memory thin films pulsed laser deposition laser desorption time of flight mass spectrometry clusters solid phase structural fragments phase change materials Ge2Sb2Te5 (GST) laser ablation
Changed by: Ing. Andrea Mikešková, učo 137293. Changed: 9/4/2015 16:08.