Publication Records

YU, Li, Dominik MUNZAR, A. V. BORIS, P. YORDANOV, Jiří CHALOUPKA, Th. WOLF, C. T. LIN, B. KEIMER and C. BERNHARD. Evidence for Two Separate Energy Gaps in Underdoped High-Temperature Cuprate Superconductors from Broadband Infrared Ellipsometry. Physical Review Letters. USA: The Americal Physical Society, 2008, vol. 100, No 17, p. 177004-177007. ISSN 0031-9007.

HUMLÍČEK, Josef and Vlastimil KŘÁPEK. Infrared Response of Heavily Doped p-type Si and SiGe Alloys from Ellipsometric Measurements. In CP772, Physics of Semiconductors: 27th International Conference on the Physics of Semiconductors. USA: American Institute of Physics, 2005, p. 113-114. ISBN 0-7354-0257--4.

HUMLÍČEK, Josef and Christian BERNHARD. Diffraction effects in infrared ellipsometry of conducting samples. Thin Solid Films. Oxford: Elsevier, 2004, 455-456, No 1, p. 177-182. ISSN 0040-6090.

DUBROKA, Adam, G. CRISTIANI, H.-U. HABERMEIER and Josef HUMLÍČEK. Infrared study of YBa2Cu3O7/La0.67Ca0.33MnO3 superlattices. Thin Solid Films. Oxford, UK: Elsevier science, 2004, vol. 2004, No 455, p. 172-176. ISSN 0040-6090.