Publication Records

ŠTOUDEK, Richard and Josef HUMLÍČEK. Infrared spectroscopy of oxygen interstitials and precipitates in nitrogen-doped silicon. Physica B condensed matter. Amsterdam: Elsevier Science, 2006, 376-377, No 6, p. 150-153. ISSN 0921-4526.

ŠTOUDEK, Richard, Michal LORENC and Josef HUMLÍČEK. Infrared Absorption Spectroscopy of Oxygen Precipitates in Nitrogen-doped Czochralski Silicon. In Proceedings of The Ninth Scientific and Business Conference SILICON 2004. Rožnov pod Radhoštěm, Česká republika: TECON Scientific, s.r.o., 2004, p. 146-150.

KLANG, Pavel, Václav HOLÝ, Richard ŠTOUDEK and Jan ŠIK. X-ray Diffuse Scattering from Defects in Nitrogen-doped Czochralski Grown Silicon Wafers. In Proceedings of The Ninth Scientific and Business Conference SILICON 2004. 2004th ed. Rožnov pod Radhoštěm, Česká republika: TECON Scientific, s.r.o., 2004, p. 53.