Výpis publikací

2005

1. Optical characterization of non-uniform thin films using imaging spectrophotometry

   OHLÍDAL, Miloslav, Vladimír ČUDEK, Ivan OHLÍDAL a Petr KLAPETEK. Optical characterization of non-uniform thin films using imaging spectrophotometry. In Advances in Optical Thin Films II. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005, s. 596329-1-596329-9, 9 s. ISBN 0-8194-5981-X.

   Podrobněji: https://is.muni.cz/publication/630337/cs