Výpis publikací

2005

1. Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry

   FRANTA, Daniel, Ivan OHLÍDAL a David PETRÝDES. Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry. Vacuum. USA: ELSEVIER (PERGAMON), 2005, roč. 80, 1-3, s. 159-162. ISSN 0042-207X.

   Podrobněji: https://is.muni.cz/publication/621749/cs