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Curriculum vitae

Person Identification
  • doc. RNDr. Petr Mikulík, Ph.D., born 1969 in Brno
Department/Faculty/University
  • Department of Condensed Matter Physics
    Faculty of Science, Masaryk University
    Kotlářská 2, CZ-611 37 Brno, Czech Republic
Function, current position
  • researcher and teacher (associate professor)
Education and academic qualifications
  • 2009, habilitation, habilitation work Absorption and Diffraction Imaging by Synchrotron Laminography, Diffractometry and Crystal Optics
  • 1997, PhD thesis "under double leadership" in Solid State Physics: X-Ray Reflectivity from Planar and Structured Multilayers. Masaryk University, Brno, Czech Republic and Université Joseph Fourier, Grenoble, France
  • 1992, DEA (equiv. MSc.) in Interaction of Matter and Radiation. Diploma thesis: La caracterisation du systeme epitaxial tungstene/saphir par la diffusion des rayons X. Université Joseph Fourier, Grenoble, France
  • 1992, RNDr./Mgr. (equiv. MSc.) in Solid State Physics. Diploma thesis: Difrakce na kvaziperiodických supermřížkách (Diffraction on Quasiperiodic Superlattices). Masaryk University, Brno, Czech Republic
Professional experience
  • 1997- : Researcher, Department of Condensed Matter Physics, Masaryk University
Teaching activities
  • Physics for chemists
  • Computer science and IT for physicists
  • Physics laboratory
  • Optometry laboratory
  • Laboratory of X-ray structure analysis
  • Clean room laboratory of silicon device technology
Research activities
  • Application of x-ray scattering methods (diffraction, reflection) for thin films, meso- and nanostructures. Simulations and applications of x-ray diffractive-refractive optical devices. Application of x-ray imaging microdiffraction technique "Rocking Curve Imaging" (RCI) for crystalline samples. Application and extension of "Synchrotron Radiation Computed Laminography" (SRCL) method for non-destructive testing of laterally extended samples and devices. Lithography and clean room technologies for semiconductor device processing. Material and structure characterisation. Calculations, numerical simulations, experiments.
Professional stays abroad
  • 2001-2002: Fraunhofer Institute for Non-destructive Testing (EADQ), Dresden, Germany
  • 1997/1998: Institute of Semiconductors, Johannes Kepler University, Linz, Austria
  • 1992-1997: CNRS, Laboratoire Louis Néel and ESRF, Grenoble, France (Mgr/DEA and PhD studies under double leadership, half-time shared with Masaryk university)
Other academic activities, research projects, grants
  • Experiments at European synchrotron radiation facilities: ESRF (Grenoble), HASYLAB (Hamburg), ANKA (Karlsruhe).
  • Chief of the clean room laborator for silicon device technology.
  • Research and educational projects, grants, ...
Non-university activities
  • Member of the board of the Czech and Slovak Crystallography Association.
  • Head of the Regional Board of Czech and Slovak Crystallographers.
  • Delegate of the Czech Republic in the European Synchrotron User Organisation
Major publications
  • NÁDAŽDY, Peter, Jakub HAGARA, Matej JERGEL, Eva MAJKOVÁ, Petr MIKULÍK, Zdenko ZÁPRAŽNÝ, Dusan KORYTÁR and Peter ŠIFFALOVIČ. Exploiting the potential of beam-compressing channel-cut monochromators for laboratory high-resolution small-angle X-ray scattering experiments. Journal of Applied Crystallography. Chester: INT UNION CRYSTALLOGRAPHY, 2019, vol. 52, JUN 2019, p. 498-506. ISSN 0021-8898. Available from: https://dx.doi.org/10.1107/S1600576719003674. URL info
  • FARAGÓ, Tomáš, Petr MIKULÍK, A. ERSHOV, M. VOGELGESANG, D. HANSCHKE and T. BAUMBACH. syris: a flexible and efficient framework for X-ray imaging experiments simulation. Journal of Synchrotron Radiation. CHESTER: INT UNION CRYSTALLOGRAPHY, 2017, vol. 24, November, p. 1283-1295. ISSN 1600-5775. Available from: https://dx.doi.org/10.1107/S1600577517012255. URL info
  • PRAJZLER, V., M. NERUDA, P. NEKVINDOVÁ and Petr MIKULÍK. Properties of Multimode Optical Epoxy Polymer Waveguides Deposited on Silicon and TOPAS Substrate. Radioengineering. PRAHA: SPOLECNOST PRO RADIOELEKTRONICKE INZENYRSTVI, 2017, vol. 26, No 1, p. 10-15. ISSN 1210-2512. Available from: https://dx.doi.org/10.13164/re.2017.0010. URL info
  • ZÁPRAŽNÝ, Z., D. KORYTÁR, M. JERGEL, P. ŠIFFALOVIČ, E. DOBROČKA, P. VAGOVIČ, C. FERRARI, Petr MIKULÍK, M. DEMYDENKO and M. MIKLOŠKA. Calculations and surface quality measurements of high-asymmetry angle x-ray crystal monochromators for advanced x-ray imaging and metrological applications. Optical Engineering. 2015, vol. 54, No 3, p. "035101-1"-"035101-12", 12 pp. ISSN 0091-3286. Available from: https://dx.doi.org/10.1117/1.OE.54.3.035101. URL info
  • LI, Z.J., A.N. DANILEWSKY, L. HELFEN, Petr MIKULÍK, D. HAENSCHKE, J. WITTGE, D. ALLEN, P. MCNALLY and T. BAUMBACH. Local strain and defects in silicon wafers due to nanoindentation revealed by full-field X-ray microdiffraction imaging. Journal of Synchrotron Radiation. USA: WILEY-BLACKWELL PUBLISHING, 2015, vol. 22, July, p. 1083-1090. ISSN 0909-0495. Available from: https://dx.doi.org/10.1107/S1600577515009650. URL info
  • ZÁPRAŽNÝ, Z., D. KORYTÁR, P. ŠIFFALOVIČ, M. JERGEL, M. DEMYDENKO, Petr MIKULÍK, E. DOBROČKA, C. FERRARI, P. VAGOVIČ and M. MIKLOŠKA. Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications. In C. Morawe, A. Khounsary, and S. Goto. Advances in X-Ray/EUV Optics and Components IX. 9207th ed. USA: SPIE-INT SOC OPTICAL ENGINEERING, 2014, p. "nestránkováno", 14 pp. ISBN 978-1-62841-234-5. Available from: https://dx.doi.org/10.1117/12.2061353. URL info
  • KORYTÁR, D., P. VAGOVIČ, K. VÉGSÖ, P. ŠIFFALOVIČ, E. DOBROČKA, W. JARK, V. ÁČ, Z. ZÁPRAŽNÝ, C. FERRARI, A. CECILIA, E. HAMANN, Petr MIKULÍK, T. BAUMBACH, M. FIEDERLE and M. JERGEL. Potential use of V-channel Ge(220) monochromators in X-ray metrology and imaging. Journal of Applied Crystallography. Hoboken: WILEY-BLACKWELL, 2013, vol. 46, No 4, p. 945-952. ISSN 0021-8898. Available from: https://dx.doi.org/10.1107/S0021889813006122. URL URL info
  • ZÁPRAŽNÝ, Z., D. KORYTÁR, Petr MIKULÍK and V. ÁČ. Processing of projections containing phase contrast in laboratory micro-computerized tomography imaging. Journal of Applied Crystallography. Hoboken: WILEY-BLACKWELL, 2013, vol. 46, Aug, p. 933-938. ISSN 0021-8898. Available from: https://dx.doi.org/10.1107/S002188981300558X. URL info
  • KORYTÁR, D., P. VAGOVIČ, C. FERRARI, P. ŠIFFALOVIČ, M. JERGEL, E. DOBROČKA, Z. ZÁPRAŽNÝ, V. ÁČ and Petr MIKULÍK. Process-induced inhomogeneities in higher asymmetry angle X-ray monochromators. In A. Khounsary, S. Goto, and C. Morawe. Advances in X-Ray/EUV Optics and Components VIII. 8848th ed. USA: SPIE-INT SOC OPTICAL ENGINEERING, 2013, p. "88480U-1-88480U-8", 8 pp. ISBN 978-0-8194-9698-0. Available from: https://dx.doi.org/10.1117/12.2025142. URL info
  • OBERTA, P., J. HRDÝ and Petr MIKULÍK. A proof-of-principle experiment of a novel harmonics separation optics for synchrotron facilities. Journal of Synchrotron Radiation. Hoboken, USA: WILEY-BLACKWELL PUBLISHING, 2012, vol. 19, No 6, p. 1012-1014. ISSN 0909-0495. Available from: https://dx.doi.org/10.1107/S0909049512036618. URL info
  • HRDÝ, J., Petr MIKULÍK and P. OBERTA. Diffractive-refractive optics: (+,-,-,+) X-ray crystal monochromator with harmonics separation. Journal of Synchrotron Radiation. 2011, vol. 18, No 1, p. 299-301. ISSN 0909-0495. Available from: https://dx.doi.org/10.1107/S0909049510049204. URL info
  • FERRARI, C., F. GERMINI, D. KORYTÁR, Petr MIKULÍK and L. PEVERINI. X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions. Journal of Applied Crystallography. 2011, vol. 44, No 44, p. 353-358. ISSN 0021-8898. Available from: https://dx.doi.org/10.1107/S0021889811001439. URL info
  • OBERTA, P., Petr MIKULÍK, M. KITTLER and J. HRDÝ. X-ray collimation by crystals with precise parabolic holes based on diffractive-refractive optics. Journal of Synchrotron Radiation. 2011, vol. 18, No 1, p. 522-526. ISSN 0909-0495. Available from: https://dx.doi.org/10.1107/S0909049511009083. URL info
  • HELFEN, L., A. MYAGOTIN, Petr MIKULÍK, P. PERNOT, A. VOROPAEV, M. ELYYAN, M. DI MICHIEL, J. BARUCHEL and T. BAUMBACH. On the implementation of computed laminography using synchrotron radiation. Review of Scientific Instruments. Melville (USA): American Institute of Physics, 2011, vol. 82, No 1, p. "nestrankovano", 8 pp. ISSN 0034-6748. URL info
  • VAGOVIČ, P., D. KORYTÁR, Petr MIKULÍK, A. CECILIA, C. FERRARI, Y. YANG, D. HANSCHKE, E. HAMANN, D. PELLICCIA, T.A. LAFFORD, M. FIEDERLE and T. BAUMBACH. In-line Bragg magnifier based on V-shaped germanium crystals. Journal of Synchrotron Radiation. 2011, vol. 18, No 1, p. 753-760. ISSN 0909-0495. Available from: https://dx.doi.org/10.1107/S090904951102989X. URL info
  • OBERTA, P., Petr MIKULÍK, M. KITTLER, J. HRDÝ and L. PEVERINI. Diffractive-refractive optics: low-aberration Bragg-case focusing by precise parabolic surfaces. Journal of Synchrotron Radiation. 2010, vol. 17, No 1, p. 36-40. ISSN 0909-0495. URL info
  • KORYTÁR, D., C. FERRARI, Petr MIKULÍK, P. VAGOVIČ, E. DOBROČKA, V. ÁČ, P. KONOPKA, A. ERKO and N. ABROSIMOV. Linearly graded GeSi beam-expanding/compressing X-ray monochromator. Journal of Applied Crystallography. 2010, vol. 2010, No 43, p. 176-178. ISSN 0021-8898. URL info
  • HOVORKA, Miloš, Filip MIKA, Petr MIKULÍK and Luděk FRANK. Profiling N-Type Dopants in Silicon. Materials Transactions. 2010, vol. 51, No 2, p. 237-242. ISSN 1345-9678. URL info
  • HUBER, I., Petr MIKULÍK and T. BAUMBACH. Correctness of a particular solution of inverse problem in rocking curve imaging (1862-6300). physica status solidi (a). Wiley, 2009, vol. 208, No 8, p. 1860-1864. ISSN 1862-6300. URL info
  • BAUMBACH, Tilo and Petr MIKULÍK. X-Ray Reflectivity by Rough Multilayers. In X-Ray and Neutron Reflectivity: Principles and Applications. Berlin: Springer, 2009, p. 235-288. Lecture Notes in Physics: 770. ISBN 978-3-540-88587-0. URL info
  • HOLÝ, Václav, T. BAUMBACH, D. LÜBBERT, L. HELFEN, M. ELLYAN, Petr MIKULÍK, S. KELLER, S.P. DENBAARS and J. SPECK. Diffuse x-ray scattering from statistically inhomogeneous distributions of threading dislocations beyond the ergodic hypothesis. Physical Review B. USA: The American Physical Society, 2008, vol. 77, No 1, p. 094102-94110. ISSN 1098-0121. URL info
  • KORYTÁR, D., C. FERRARI, Petr MIKULÍK, F. GERMINI, P. VAGOVIČ and T. BAUMBACH. High Resolution 1D and 2D Crystal Optics Based on Asymmetric Diffractors. In Modern Developments in X-Ray and Neutron Optics. Berlin: Springer, 2008, p. 501-512. Springer Series in Optical Sciences 137. ISBN 978-3-540-74560-0. URL info
  • ÁČ, V., P. PERICHTA, D. KORYTÁR and Petr MIKULÍK. Thermal effects under synchrotron radiation power absorption. In Modern Developments in X-Ray and Neutron Optics. Berlín: Springer, 2008, p. 513-524. Springer Series in Optical Sciences 137. ISBN 978-3-540-74560-0. URL info
  • LÜBBERT, D., T. BAUMBACH, Václav HOLÝ, Petr MIKULÍK, L. HELFEN, P. PERNOT, M. ELLYAN, S. KELLER, T.M. KATONA, S.P. DENBAARS and J. SPECK. Microdiffraction imaging of dislocation densities in microstructured samples. Europhysics Letters. Paríž: European Physical Society, 2008, vol. 82, No 5, p. 56002-56006. ISSN 0295-5075. URL info
  • KULHA, P., A. BOURA, M. HUSÁK, Petr MIKULÍK, Milan KUČERA and Stanislav VALENDA. Design and Fabrication of High-Temperature SOI Strain-Gauges. In 7th International Conference on Advanced Semiconductor Devices and Microsystems. New York: IEEE, 2008, p. 175-178. ISBN 978-1-4244-2325-5. info
  • HELFEN, L., A. MYAGOTIN, A. RACK, P. PERNOT, Petr MIKULÍK, M. DIMICHIEL and T. BAUMBACH. Synchrotron-radiation computed laminography for high-resolution three-dimensional imaging of flat devices. Physica stat.sol.(a). 2007, vol. 204, No 8, p. 2760-2765. ISSN 0031-8965. URL info
  • VAGOVIČ, P., D. KORYTÁR, Petr MIKULÍK and C. FERRARI. On the design of a monolithic 4-bounce high resolution X-ray monochromator. Nuclear Instruments and Methods in Physics Research Section B. ELSEVIER (NORTH-HOLLAND), 2007, vol. 265, No 2, p. 599-604. ISSN 0168-583X. URL info
  • HELFEN, L., T. BAUMBACH, D. KIEL, P. PERNOT, Petr MIKULÍK, P. CLOETENS and J. BARUCHEL. Three-dimensional Imaging by Synchrotron Radiation Computed Laminography. ESRF Highlights 2005. Francie: ESRF, 2006, vol. 2006, No 1, p. 107-108. info
  • LÜBBERT, D., Petr MIKULÍK, P. PERNOT, L. HELFEN, M.D. CRAVEN, S. KELLER, S. DENBAARS and T. BAUMBACH. X-ray microdiffraction imaging investigations of wing tilt in epitaxially overgrown GaN. Physica stat.sol.(a). 2006, vol. 203, No 7, p. 1733-1738. ISSN 0031-8965. URL info
  • HELFEN, L., A. MYAGOTIN, P. PERNOT, M. DIMICHIEL, Petr MIKULÍK, A. BERTHOLD and T. BAUMBACH. Investigation of hybrid pixel detector arrays by synchrotron-radiation imaging. Nuclear Instruments & Methods in Physics Research A. 2006, vol. 563, No 1, p. 163-166. ISSN 0168-9002. URL info
  • MIKULÍK, Petr, D. LÜBBERT, P. PERNOT, L. HELFEN and T. BAUMBACH. Crystallite misorientation analysis in semiconductor wafers and ELO samples by rocking curve imaging. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2006, vol. 253, No 1, p. 188-193. ISSN 0169-4332. URL info
  • LÜBBERT, D., C. FERRARI, Petr MIKULÍK, P. PERNOT, L. HELFEN, N. VERDI, D. KORYTÁR and T. BAUMBACH. Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging. J. Appl. Crystallography. Velká Britanie: Int. Union of Crystallography, 2005, vol. 38, No 1, p. 91-96. ISSN 0021-8898. URL info
  • LÜBBERT, D., T. BAUMBACH, Petr MIKULÍK, P. PERNOT, L. HELFEN, R. KÖHLER, T.M. KATONA, S. KELLER, T.M. KATONA and S.P. DENBAARS. Local wing tilt analysis of laterally overgrown GaN by x-ray rocking curve imaging. Journal of physics D: Applied physics. Bristol, England: IOP Publishing Ltd., 2005, vol. 38, 10A, p. A50-A5, 5 pp. ISSN 0022-3727. URL info
  • HELFEN, L., T. BAUMBACH, Petr MIKULÍK, D. KIEL, P. PERNOT, P. CLOETENS and J. BARUCHEL. High-resolution three-dimensional imaging of flat objects by synchrotron-radiation computed laminography. Applied Physics Letters. USA: American Institute of Physics, 2005, vol. 86, No 1, p. 071915-1, 3 pp. ISSN 0003-6951. URL info
  • CAHA, Ondřej, Petr MIKULÍK, Jiří NOVÁK, Václav HOLÝ, Simon C. MOSS and Andrew NORMAN. Spontaneous lateral modulation in short-period superlattices investigated by grazing-incidence X-ray diffraction. Physical Review B. USA: American Physical Society, 2005, vol. 72, No 3, p. 035313-35322. ISSN 1098-0121. info
  • HELFEN, L., F. DEHN, Petr MIKULÍK and T. BAUMBACH. Three-dimensional imaging of cement microstructure evolution during hydration Three-dimensional imaging of cement microstructure evolution during hydration. Advances in Cement Research. London, 2005, vol. 17, No 3, p. 103-111. ISSN 0951-7197. URL info
  • BAUMBACH, T., L. HELFEN, Petr MIKULÍK and F. DEHN. Synchrotron-radiation X-ray tomography: a method for 3D imaging of cement microstructure and its evolution during hydration. In Proceedings of XIV. International Symposium SANACE 2004. Brno: Sdružení pro sanace betonových konstrukcí, 2004, p. 71-80. ISSN 1211-3700. URL info
  • MIKULÍK, Petr, D. LÜBBERT, D. KORYTÁR, P. PERNOT and T. BAUMBACH. Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2003, vol. 36, No 1, p. A74-A78, 5 pp. ISSN 0022-3727. URL info
  • KORYTÁR, D., Petr MIKULÍK, C. FERRARI, J. HRDÝ, T. BAUMBACH, A. FREUND and Alan KUBĚNA. Two-dimensional x-ray magnification based on a monolithic beam conditioner. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2003, vol. 36, No 1, p. A65-A68, 4 pp. ISSN 0022-3727. URL info
  • MIKULÍK, Petr, M. JERGEL, T. BAUMBACH, E. MAJKOVÁ, E. PINČÍK, Š. LUBY, L. ORTEGA, R. TUCOULOU, P. HUDEK and I. KOSTIČ. Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2001, vol. 34, 10A, p. A188, 5 pp. ISSN 0022-3727. URL info
  • JERGEL, M., Petr MIKULÍK, E. MAJKOVÁ, Š. LUBY, R. SENDERÁK, E. PINČÍK, M. BRUNEL, I. KOSTIČ and A. KONEČNÍKOVÁ. Structural characterization of lamellar multilayer gratings by X-ray reflectivity and scanning electron microscopy. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 1999, vol. 32, No 9999, p. A220, 4 pp. ISSN 0022-3727. URL info
  • MIKULÍK, Petr and T. BAUMBACH. X-ray reflection by rough multilayer gratings: Dynamical and kinematical scattering. Phys. Rev. B. USA: The American Phys. Society, 1999, vol. 59, No 11, p. 7632-7643. ISSN 0163-1829. URL info
  • STANGL, J., Václav HOLÝ, Petr MIKULÍK, G. BAUER, I. KEGEL, T.H. METZGER, O.G. SCHMIDT, C. LANGE and K. EBERL. Self-assembled carbon-induced germanium quantum dots studied by grazing-incidence small-angle x-ray scattering. Applied Physics Letters. USA: American Institute of Physics, 1999, vol. 74, -, p. 3785-3787. ISSN 0003-6951. info
  • LITZMAN, Otto and Petr MIKULÍK. The crystal truncation rod scattering of neutrons and the multiwave dynamical theory of diffraction. J. Phys. Condens. Matter. IOP Publishing Ltd, 1999, vol. 11, No 30, p. 5767-5779. ISSN 0953-8984. info
  • MIKULÍK, Petr. X-ray reflectivity from planar and structured multilayers : Réflectivité des rayons X par des milticouches planaires et structurées (Souběž.) : Rentgenová reflektivita rovinných a strukturovaných multivrstev (Souběž.). 1997, 151 s. info

2024/11/08

Curriculum vitae: doc. RNDr. Petr Mikulík, Ph.D. (učo 855), version: English(1), last update: 2024/11/08 12:27, P. Mikulík

Another Variant: Czech(3)