Curriculum Vitae

Curriculum vitae

Person Identification

• Miroslav Valtr
  Born November 9, 1979 in Brno, Czech Republic
  married, 3 children

Workplace

• Czech Metrology Institute
  Department of Nanometrology
  Okružní 31
  638 00 Brno
  Czech Republic

Employment Position

• metrologist

Education and Academic Qualifications

• 30. 9. 2010: Ph.D. in Plasma Physics
• 2003 - 2010: Masaryk University in Brno, Faculty of Science, Ph.D. student, Ph.D. thesis: Deposition of Carbon Films in Plasma and Their Characterisation
• 13. 6. 2003: M.Sc. (equiv.) in Physics, Diploma thesis: Plasma Deposition of Thin DLC:SiOx Films and Their Characterisation
• 1998 - 2003: Masaryk University in Brno, Faculty of Science
• 1991 - 1998: Secondary School 'Gymnazium', Mikulov
• 1986 - 1991: Primary School, Mikulov

Employment Summary

• since 2. 1. 2007: Czech Metrology Institute, Department of Nanometrology, metrologist
• 1. 1. 2006 - 31. 12. 2006: Department of Physical Electronics, faculty of Science, Masaryk University, research scientist
• summer of 2002: worker for TESLA SEZAM Roznov p.R., a prominent manufacturer of semiconductor components

Scientific and Research Activities

• 2007 - now: research and development in the field of scanning probe microscopy, ResearcherID: E-3342-2012, ORCID: 0000-0002-7628-9184
• 2004 - 2006: PECVD deposition of carbon thin films, ellipsometrical measurement, measurement of reflectance, under Prof. Ivan Ohlidal, Department of Physical Electronics, Masaryk University
• 2002 - 2003: deposition and characterisation of DLC films deposited by PECVD, under Dr. L. Zajickova, Department of Physical Electronics, Masaryk University, co-solver of the FRVS 0601/2003 grant from Ministry of Education
• 2001: study of surface energy of polymer-like thin films deposited by PECVD by means of contact angle measurements, in the group of Prof. C. Wiesemann at the Ruhr-Universitaet Bochum
• 2000 - 2001: research work within the range of the FRVS 0610/2001 grant from Ministry of Education, under the leadership Dr. L. Zajickova, Plasmochemical Laboratory, Masaryk University

Academical Stays

• 10/2001 - 12/2001: Department of Physics, Ruhr-Universitaet Bochum, Germany (in the research group of Prof. C. Wiesemann)

Grants

• co-solver of grant 9B22001: Operando metrology for energy storage materials
• co-solver of grant 8B21001: Pushing boundaries of nano-dimensional metrology by light
• co-solver of grant 8B18001: Light-matter interplay for optical metrology beyond the classical spatial resolution limits
• co-solver of grant 8B15001: Advanced 3D chemical metrology for innovative technologies
• co-solver of grant 7AX15002: Traceable characterisation of thin-film materials for energy applications
• co-solver of grant 7AX13032: Crystalline surfaces, self assembled structures, and nano-origami as length standards in (nano)metrology
• co-solver of grant 7AX13018: Novel electronic devices based on control of strain at the nanoscale
• co-solver of grant 7AX13004: Traceable characterisation of nanostructured devices
• solver of the FRVŠ 2181/2005 grant: Studium vlastností uhlíkových polymerních vrstev připravovaných v pulzních vysokofrekvenčních doutnavých výbojích
• co-solver of the FRVŠ 0601/2003 grant: Studium procesů a produktů plazmochemických reakcí

Selected Publications

• VALTR, Miroslav, Petr KLAPETEK, Jan MARTINEK, Ondrej NOVOTNY, Zdenek JELINEK, Vaclav HORTVIK and David NECAS. Scanning Probe Microscopy controller with advanced sampling support. HardwareX. AMSTERDAM: Elsevier, 2023, vol. 15, 11 pp. Available from: https://dx.doi.org/10.1016/j.ohx.2023.e00451. info
• NECAS, David, Miroslav VALTR and Petr KLAPETEK. How levelling and scan line corrections ruin roughness measurement and how to prevent it. Nature Scientific Reports. BERLIN: NATURE PORTFOLIO, 2020, vol. 10, No 1, 15 pp. ISSN 2045-2322. Available from: https://dx.doi.org/10.1038/s41598-020-72171-8. info
• MARTINEK, Jan, Miroslav VALTR, Vaclav HORTVIK, Petr GROLICH, Danick BRIAND, Marjan SHAKER and Petr KLAPETEK. Large area scanning thermal microscopy and infrared imaging system. MEASUREMENT SCIENCE & TECHNOLOGY. BRISTOL: IOP PUBLISHING LTD, 2019, vol. 30, No 3, 12 pp. ISSN 0957-0233. Available from: https://dx.doi.org/10.1088/1361-6501/aafa96. info
• KLAPETEK, Petr, Andrew YACOOT, Petr GROLICH, Miroslav VALTR and David NEČAS. Gwyscan: a library to support non-equidistant Scanning Probe Microscope measurements. Measurement Science and Technology. Bristol: IOP Pub., 2017, vol. 28, No 3, p. nestránkováno, 11 pp. ISSN 0957-0233. Available from: https://dx.doi.org/10.1088/1361-6501/28/3/034015. Plný text u vydavatele info
• KLAPETEK, Petr, Miroslav VALTR, David NEČAS, Ota SALYK and Petr DZIK. Atomic force microscopy analysis of nanoparticles in non-ideal conditions. Nanoscale Research Letter. New York: Springer, 2011, vol. 6, No 1, p. "nestránkováno", 9 pp. ISSN 1931-7573. Available from: https://dx.doi.org/10.1186/1556-276X-6-514. info
• KLAPETEK, Petr, Miroslav VALTR and Martin MATULA. A long-range scanning probe microscope for automotive reflector optical quality inspection. MEASUREMENT SCIENCE & TECHNOLOGY. BRISTOL: IOP PUBLISHING LTD, 2011, vol. 22, No 9, 7 pp. ISSN 0957-0233. Available from: https://dx.doi.org/10.1088/0957-0233/22/9/094011. info
• KLAPETEK, Petr, Miroslav VALTR, Aleš PORUBA, David NEČAS and Miloslav OHLÍDAL. Rough surface scattering simulations using graphics cards. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2010, vol. 2010, No 256, p. 5640-5643. ISSN 0169-4332. info
• KLAPETEK, Petr and Miroslav VALTR. Near-field optical microscopy simulations using graphics processing units. Surface and Interface Analysis. 2010, 42/2010, No 6, 5 pp. ISSN 1096-9918. info
• MAN, Jiří, Miroslav VALTR, Anja WEIDNER, Martin PETRENEC, Karel OBRTLÍK and Jaroslav POLÁK. AFM study of surface relief evolution in 316L steel fatigued at low and high temperatures. FATIGUE 2010. 2010, vol. 2010, No 1, p. 1625-1633. ISSN 1877-7058. info
• VALTR, Miroslav, Petr KLAPETEK, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL and Daniel FRANTA. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge. Chem. listy. Praha: Česká společnost chemická, 2008, vol. 102, No 16, p. 1529-1532. ISSN 0009-2770. URL info
• VALTR, Miroslav, Petr KLAPETEK, Ivan OHLÍDAL and Daniel FRANTA. UV light enhanced oxidation of a-C:H thin film in air: A study of thickness reduction. Optoelectronics and Advanced Materials - Rapid Communications. Bucharest: INOE & INFM, 2007, vol. 1, No 11, p. 620-624. ISSN 1842-6573. URL info
• VALTR, Miroslav, Ivan OHLÍDAL and Daniel FRANTA. Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry. Czech. J. Phys. Praha: Institute of Physics Academy of Sciences, 2006, 56/2006, Suppl. B, p. 1103 - 1109. ISSN 0011-4626. info

2024/03/22

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