F7850 Selected topics in electron microscopy

Faculty of Science
Spring 2012
Extent and Intensity
2/0. 2 credit(s) (plus extra credits for completion). Type of Completion: z (credit).
Teacher(s)
RNDr. Lubomír Tůma (lecturer), Mgr. Filip Münz, PhD. (deputy)
Ing. Tomáš Vystavěl, PhD. (lecturer), doc. RNDr. Petr Mikulík, Ph.D. (deputy)
Guaranteed by
prof. RNDr. Michal Lenc, Ph.D.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: doc. RNDr. Petr Mikulík, Ph.D.
Supplier department: Department of Condensed Matter Physics – Physics Section – Faculty of Science
Timetable
Wed 14:00–15:50 Fs1 6/1017
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
there are 9 fields of study the course is directly associated with, display
Course objectives
After succesfull passing the course, the students should be able to:
- describe the construction of various types electron microscopes
- characterise individual physical phenomena yielding the image and discuss the function of the aparatus blocks
- evaluate the utility of different types EM for particular sample measurement.
Syllabus
  • 1. Basics of scanning and transmission electron microscopy
  • 2. Applications of electron microscopy
  • 3. Electron and ion optics
  • 4. Sources of electrons and ions
  • 5. Interaction of electrons and ions with solid state matter
  • 6. Ssignal detection im electron microscopy
  • 7. Vacuum system
  • 8. Sample manipulation inside electron microscope
  • 9. Sample stages
  • 10. Electron microscope as a system
  • 11. Contrast of image 1. (SEM)
  • 12. Contrast of image 2. (TEM)
  • 13. Electron microscope as an analytical lab
  • 14. Mopdern trends in electron microscopy
  • 15. Practical demonstration
Literature
    recommended literature
  • GOLDSTEIN, Joseph I. Scanning electron microscopy and X-ray microanalysis. 3rd ed. New York: Kluwer Academic/Plenum publishers, 2003, xix, 689 s. ISBN 0-306-47292-9. info
  • Transmission electron microscopy : physics of image formation and microanalysis. Edited by Ludwig Reimer. 3. ed. Berlin: Springer, 1993, 545 s. ISBN 3540568492. info
  • Scanning electron microscopy : physics of image formation and microanalysis. Edited by Ludwig Reimer. Berlin: Springer-Verlag, 1985, 457 s. ISBN 3540135308. info
Teaching methods
lectures + hands on lesson
Assessment methods
credits, based on final discussion
Language of instruction
Czech
Further comments (probably available only in Czech)
Study Materials
The course is taught annually.
The course is also listed under the following terms spring 2012 - acreditation, Spring 2013, Spring 2014, Spring 2015, Spring 2016, spring 2018, Spring 2020, Spring 2022, Autumn 2024, Spring 2025.
  • Enrolment Statistics (Spring 2012, recent)
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