F7850 Selected topics in electron microscopy

Faculty of Science
Autumn 2024
Extent and Intensity
2/0/0. 2 credit(s) (plus extra credits for completion). Type of Completion: k (colloquium).
Teacher(s)
RNDr. Lubomír Tůma (lecturer)
Ing. Tomáš Vystavěl, PhD. (lecturer), doc. RNDr. Petr Mikulík, Ph.D. (deputy)
Guaranteed by
doc. RNDr. Petr Mikulík, Ph.D.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: doc. RNDr. Petr Mikulík, Ph.D.
Supplier department: Department of Condensed Matter Physics – Physics Section – Faculty of Science
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
there are 9 fields of study the course is directly associated with, display
Course objectives
After succesfull passing the course, the students should be able to:
- describe the construction of various types electron microscopes
- characterise individual physical phenomena yielding the image and discuss the function of the aparatus blocks
- evaluate the utility of different types EM for particular sample measurement.
Learning outcomes
After successful passing of the subject the students will be able to:
– describe construction of different types of electron microscopes,
– describe different parts of electron microscopes,
– describe electron sources,
– understand interaction of electrons with samples and measuring of the output signal,
– describe sample stages and chambers as well as sample manipulation.
Syllabus
  • 1. Basics of scanning and transmission electron microscopy
  • 2. Applications of electron microscopy
  • 3. Electron and ion optics
  • 4. Sources of electrons and ions
  • 5. Interaction of electrons and ions with solid state matter
  • 6. Signal detection im electron microscopy
  • 7. Vacuum system
  • 8. Sample manipulation inside electron microscope
  • 9. Sample stages
  • 10. Electron microscope as a system
  • 11. Contrast of image 1. (SEM)
  • 12. Contrast of image 2. (TEM)
  • 13. Electron microscope as an analytical lab
  • 14. Mopdern trends in electron microscopy
  • 15. Practical demonstration
Teaching methods
lectures + hands on lesson
Assessment methods
credits, based on final discussion
Language of instruction
Czech
Further comments (probably available only in Czech)
The course is taught annually.
The course is taught: every week.
The course is also listed under the following terms Spring 2012, spring 2012 - acreditation, Spring 2013, Spring 2014, Spring 2015, Spring 2016, spring 2018, Spring 2020, Spring 2022, Spring 2025.
  • Enrolment Statistics (Autumn 2024, recent)
  • Permalink: https://is.muni.cz/course/sci/autumn2024/F7850