F7850 Selected topics in electron microscopy

Faculty of Science
Autumn 2024
Extent and Intensity
2/0/0. 2 credit(s) (plus extra credits for completion). Type of Completion: k (colloquium).
Teacher(s)
doc. RNDr. Petr Mikulík, Ph.D. (lecturer)
RNDr. Lubomír Tůma (lecturer)
Ing. Tomáš Vystavěl, PhD. (lecturer), doc. RNDr. Petr Mikulík, Ph.D. (deputy)
Guaranteed by
doc. RNDr. Petr Mikulík, Ph.D.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: doc. RNDr. Petr Mikulík, Ph.D.
Supplier department: Department of Condensed Matter Physics – Physics Section – Faculty of Science
Timetable
Thu 16:30–18:20 Fs1 6/1017
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
there are 9 fields of study the course is directly associated with, display
Course objectives
After succesfull passing the course, the students should be able to:
- describe the construction of various types electron microscopes
- characterise individual physical phenomena yielding the image and discuss the function of the aparatus blocks
- evaluate the utility of different types EM for particular sample measurement.
Learning outcomes
After successful passing of the subject the students will be able to:
– describe construction of different types of electron microscopes,
– describe different parts of electron microscopes,
– describe electron sources,
– understand interaction of electrons with samples and measuring of the output signal,
– describe sample stages and chambers as well as sample manipulation.
Syllabus
  • 1. Basics of scanning and transmission electron microscopy
  • 2. Applications of electron microscopy
  • 3. Electron and ion optics
  • 4. Sources of electrons and ions
  • 5. Interaction of electrons and ions with solid state matter
  • 6. Signal detection im electron microscopy
  • 7. Vacuum system
  • 8. Sample manipulation inside electron microscope
  • 9. Sample stages
  • 10. Electron microscope as a system
  • 11. Contrast of image 1. (SEM)
  • 12. Contrast of image 2. (TEM)
  • 13. Electron microscope as an analytical lab
  • 14. Mopdern trends in electron microscopy
  • 15. Practical demonstration
Teaching methods
lectures + hands on lesson
Assessment methods
credits, based on final discussion
Language of instruction
Czech
Further comments (probably available only in Czech)
Study Materials
The course is taught annually.
The course is also listed under the following terms Spring 2012, spring 2012 - acreditation, Spring 2013, Spring 2014, Spring 2015, Spring 2016, spring 2018, Spring 2020, Spring 2022.
  • Enrolment Statistics (recent)
  • Permalink: https://is.muni.cz/course/sci/autumn2024/F7850