F7360 Characterization of Surfaces and Thin Films

Faculty of Science
Spring 2024
Extent and Intensity
2/1/0. 2 credit(s) (plus extra credits for completion). Type of Completion: k (colloquium).
Teacher(s)
doc. Mgr. Lenka Zajíčková, Ph.D. (lecturer)
Guaranteed by
doc. Mgr. Lenka Zajíčková, Ph.D.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: doc. Mgr. Lenka Zajíčková, Ph.D.
Supplier department: Department of Condensed Matter Physics – Physics Section – Faculty of Science
Course Enrolment Limitations
The course is offered to students of any study field.
Course objectives
This course gives overview of physical methods for characterization of surfaces and thin films.
Learning outcomes
At the end of the course students will be able to:
explain differences between different bonds in solids;
explain differences between types of solids;
discuss processes on clean surfaces and propose suitable methods for clean surface preparation;
discuss processes of physisorption and chemisorption;
describe interaction of materials with various radiation beams (including electrons and ions);
decide about the selection and sequence of characterization methods for a particular material and problem of analysis.
Syllabus
  • 1. Bonds in solids (ionic, covalent, van der Waals, metallic)
  • 2. Types of materials (crystal structures, ceramics, glasses, metals, polymers, composites)
  • 3. Physics at surfaces (surface tension, electronics of surfaces, work function, surface states, thermoemission, adsorption, chemisorption, methods for preparation of clean surfaces)
  • 4. Interaction of photons with materials and principles of spectroscopic characterization methods (Mössbauer effect, photoeffect, spectrophotometry and ellipsometry, Ramanova spectroscopy, infrared spectroscopy, NMR, EPR)
  • 5. Interaction of particles (electrons, neutrons, ions/atoms) with condensed matter
  • 6. Electron spectroscopy (electron sources, energy analysers, ultraviolet photoelectron spectroscopy, X-ray photoelectron spectroscopy, Auger spectroscopy, spectroscopy of energy losses)
  • 7. Ion beam methods (ion sources, mass analyzers, Rutherford backscattering spectroscopy - RBS, elastic recoil detection analysis - ERDA, nuclear resonance reaction analysis - NRA, secondary ion mass spectrometry - SIMS, fast atom bombardment - FAB, matrix-assisted laser desorption ionization - MALDI)
Literature
  • FLEWITT, P. E. J. and R. K. WILD. Physical methods for materials characterisation. Bristol: Institute of Physics Publishing, 1994, xvi, 517. ISBN 0750303204. info
Teaching methods
The course is composed of lectures explaining all the topics in the syllabus. Besides, the students discuss proposals for characterization of certain model samples and try to analyze experimental data. The part of the course is an excursion to laboratories with characterization methods.
Assessment methods
The course is finished by colloquium. Requirements for gaining the credits:
- read and understand an English scientific paper focused on thin films or surface characterization,
- comment and discuss the selected scientific paper in own oral presentation,
- show the knowledge of the subject in a written test.
Language of instruction
English
Follow-Up Courses
Further comments (probably available only in Czech)
The course can also be completed outside the examination period.
The course is taught once in two years.
The course is taught: every week.
General note: L.
Teacher's information
If fewer than 5 students are enrolled, the course will be taught in a block scheme agreed upon at the beginning of the semester.
The course is also listed under the following terms Autumn 1999, Spring 2008 - for the purpose of the accreditation, Autumn 2000, Spring 2002, Autumn 2002, Autumn 2003, Spring 2005, Spring 2006, Spring 2007, Spring 2008, Spring 2009, Spring 2010, Spring 2012, spring 2012 - acreditation, Spring 2014, Spring 2016, spring 2018, Spring 2020, Spring 2022.
  • Enrolment Statistics (recent)
  • Permalink: https://is.muni.cz/course/sci/spring2024/F7360