G8591 XRD Difraction

Faculty of Science
Spring 2024
Extent and Intensity
1/1. 2 credit(s). Type of Completion: z (credit).
Teacher(s)
Milan Rieder, Ph.D. (lecturer), prof. RNDr. Milan Novák, CSc. (deputy)
prof. RNDr. Milan Novák, CSc. (alternate examiner)
Guaranteed by
prof. RNDr. Milan Novák, CSc.
Department of Geological Sciences – Earth Sciences Section – Faculty of Science
Contact Person: Ing. Jana Pechmannová
Supplier department: Department of Geological Sciences – Earth Sciences Section – Faculty of Science
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
there are 38 fields of study the course is directly associated with, display
Course objectives
To learn to use the powder XRD diffraction method
Learning outcomes
After graduation, the student is able to prepare a sample and interpret the measured results.
Syllabus
  • The main aspects covered during the course are the following: • basic principles of X-ray diffraction; • hardware components and their function; • practical aspects of sample preparation; • practical aspects of data collection, optimization of scan parameters, scan optimization with fluorescent samples; • set-up of measurement programs in Data Collector, automation possibilities; • pattern treatment, phase identification, crystallite size analysis, and set-up of analysis routines in HighScore software; • case studies
Literature
  • ZUO, Jian Min and John C. H. SPENCE. Advanced transmission electron microscopy : imaging and diffraction in nanoscience. New York: Springer, 2017, xxvi, 729. ISBN 9781493966059. info
  • VÁVRA, Václav and Radovan TVRDÝ. Stanovení kvantitativního zastoupení minerálů v horninách - metoda RTG práškové difrakce na příkladu olivínu (The determination of the mineral content in rocks - XRD method applied to the olivine example). In Geologické výzkumy na Moravě a ve Slezsku v roce 2004. 1st ed. Brno: Masarykova univerzita, 2005, p. 119-121, 121 pp. ISBN 80-210-3761-X. info
  • HOVORKA, Miloš. Rtg difrakce na monokrystalických vrstvách GaAs/InAs. 2002, 27 l. info
  • KRČMÁŘ, Jan. Rtg difrakce na polykrystalických vrstvách PtSi. 2002, 35 l. info
Teaching methods
Lectures, excercises
Assessment methods
test
Language of instruction
Czech
Further comments (probably available only in Czech)
Study Materials
The course can also be completed outside the examination period.
The course is taught once in two years.
Information on the per-term frequency of the course: Bude otevřeno v jarním semestru 2023/2024.
The course is taught: every week.
The course is also listed under the following terms Spring 2008, Spring 2012, spring 2012 - acreditation, Spring 2014, Spring 2016, Spring 2020, Autumn 2020, Autumn 2022.
  • Enrolment Statistics (recent)
  • Permalink: https://is.muni.cz/course/sci/spring2024/G8591