PřF:G8591 XRD Difraction - Course Information

G8591 XRD Difraction

Extent and Intensity

1/1. 2 credit(s). Type of Completion: z (credit).

Teacher(s)

Milan Rieder, Ph.D. (lecturer), prof. RNDr. Milan Novák, CSc. (deputy)
prof. RNDr. Milan Novák, CSc. (alternate examiner)

Guaranteed by

prof. RNDr. Milan Novák, CSc.
Department of Geological Sciences – Earth Sciences Section – Faculty of Science
Contact Person: Ing. Jana Pechmannová
Supplier department: Department of Geological Sciences – Earth Sciences Section – Faculty of Science

Course Enrolment Limitations

The course is also offered to the students of the fields other than those the course is directly associated with.

fields of study / plans the course is directly associated with

• Applied and environmental geology (programme PřF, B-AEG) (2)
• Applied and environmental geology (programme PřF, N-AEG) (2)
• Geoenvironmental risks and remediations (programme PřF, N-GRS) (2)
• Geology (Eng.) (programme PřF, B-GE) (2)
• Geology (Eng.) (programme PřF, N-GE) (2)
• Applied and Environmental Geology (Eng.) (programme PřF, B-GE) (2)
• Applied and Environmental Geology (programme PřF, B-GE) (2)
• Applied and Environmental Geology (programme PřF, N-GE) (2)
• Geology combined with Archaeology (programme PřF, B-GE) (2)
• Geology combined with Archaeology (programme PřF, N-GE) (2)
• Geology for Multi-Branches Study (programme PřF, B-GE) (2)
• Geology (programme PřF, B-GE) (2)
• Geology (programme PřF, B-GEO) (2)
• Geology (programme PřF, N-GE) (2)
• Geology (programme PřF, N-GEO) (2)
• Geology with a view to Education (programme PřF, B-GK)
• Geology with a view to Education (programme PřF, B-CH)
• Principles of geology (programme PřF, B-GEO) (2)
• Principles of geology (programme PřF, N-GEO) (2)
• Administrative Geology (programme PřF, B-GE) (2)

Course objectives

To learn to use the powder XRD diffraction method

Learning outcomes

After graduation, the student is able to prepare a sample and interpret the measured results.

Syllabus

• The main aspects covered during the course are the following: • basic principles of X-ray diffraction; • hardware components and their function; • practical aspects of sample preparation; • practical aspects of data collection, optimization of scan parameters, scan optimization with fluorescent samples; • set-up of measurement programs in Data Collector, automation possibilities; • pattern treatment, phase identification, crystallite size analysis, and set-up of analysis routines in HighScore software; • case studies

Literature

• ZUO, Jian Min and John C. H. SPENCE. Advanced transmission electron microscopy : imaging and diffraction in nanoscience. New York: Springer, 2017, xxvi, 729. ISBN 9781493966059. info
• VÁVRA, Václav and Radovan TVRDÝ. Stanovení kvantitativního zastoupení minerálů v horninách - metoda RTG práškové difrakce na příkladu olivínu (The determination of the mineral content in rocks - XRD method applied to the olivine example). In Geologické výzkumy na Moravě a ve Slezsku v roce 2004. 1st ed. Brno: Masarykova univerzita, 2005, p. 119-121, 121 pp. ISBN 80-210-3761-X. info
• HOVORKA, Miloš. Rtg difrakce na monokrystalických vrstvách GaAs/InAs. 2002, 27 l. info
• KRČMÁŘ, Jan. Rtg difrakce na polykrystalických vrstvách PtSi. 2002, 35 l. info

Teaching methods

Lectures, excercises

Assessment methods

test

Language of instruction

Czech

Further comments (probably available only in Czech)

Study Materials
The course can also be completed outside the examination period.
The course is taught once in two years.
Information on the per-term frequency of the course: Bude otevřeno v jarním semestru 2023/2024.
The course is taught: every week.

• Enrolment Statistics (recent)
  
• Permalink: https://is.muni.cz/course/sci/spring2024/G8591