F9810 Microscopy lab III

Faculty of Science
Autumn 2024
Extent and Intensity
0/0/5. 6 credit(s) (plus extra credits for completion). Type of Completion: z (credit).
Teacher(s)
Mgr. Milan Ešner, Ph.D. (lecturer)
Mgr. Jana Jurmanová, Ph.D. (lecturer)
Mgr. Mojmír Meduňa, Ph.D. (lecturer)
doc. RNDr. Petr Mikulík, Ph.D. (lecturer)
Mgr. Jiří Nováček, Ph.D. (lecturer)
Mgr. Jan Přibyl, Ph.D. (lecturer)
Guaranteed by
doc. RNDr. Petr Mikulík, Ph.D.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: doc. RNDr. Petr Mikulík, Ph.D.
Supplier department: Department of Condensed Matter Physics – Physics Section – Faculty of Science
Prerequisites
Knowledge of the basics of microscopy techniques, the principles of microscopy instruments and of types of interaction between electromagnetic radiation or particles and material.
Course Enrolment Limitations
The course is offered to students of any study field.
Course objectives
The course allows students to work with advanced microscopy instruments for mapping various properties of samples, and enables them to understand the application potential of various methods and the processing and analysis of measured data.
Learning outcomes
Completing the course, the student will be able to:
- understand the principles of different types of microscopy techniques and of different types of relevant devices for mapping the surface and volume properties of materials,
- describe the various types of interaction of incident radiation or particles and material and understand the application contexts,
- know about the sample preparation,
- analyze and interpret captured images.
Syllabus
  • Measurement of graphene by low-voltage scanning electron microscopy (LEEM)
  • Cryo-electron microscopy in biotechnology (Cryo-SEM) and sample preparation
  • Raman spectroscopy in biotechnology and clinical practice
  • Infrared Microscopy (FTIR) Mapping
  • Atomic Force Microscopy (AFM)
  • Scanning Probe Microscopy (SPM)
  • Secondary Ion Mass Spectroscopy (SIMS)
  • X-ray imaging methods (radiography, computed tomography)
Literature
    required literature
  • Návody k jednotlivým úlohám
    recommended literature
  • X-ray data booklet - http://xdb.lbl.gov/
Teaching methods
Practical work at Faculty of Science and CEITEC MU, CEITEC Nano, Institute of Scientific Instruments CAS, and some other institutes according to the instrumentation availability
Assessment methods
Credit after submitting and testing of protocols from all tasks.
Language of instruction
Czech
Further Comments
The course is taught annually.
The course is taught: every week.
The course is also listed under the following terms Autumn 2023.
  • Enrolment Statistics (recent)
  • Permalink: https://is.muni.cz/course/sci/autumn2024/F9810