F7840 Electron microscopy and its applications in materials research

Faculty of Science
Autumn 2004
Extent and Intensity
2/0/0. 3 credit(s). Type of Completion: k (colloquium).
Teacher(s)
RNDr. Jiří Buršík, DSc. (lecturer)
RNDr. Alena Orlová, CSc. (lecturer), prof. RNDr. Josef Humlíček, CSc. (deputy)
Guaranteed by
prof. RNDr. Josef Humlíček, CSc.
Department of Condensed Matter Physics - Physics Section - Faculty of Science
Contact Person: RNDr. Alena Orlová, CSc.
Timetable
Fri 11:00–12:50 FUA
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
Course objectives
Interaction of electrons with solids, types of electron microscopes. Imaging in a transmission electron microscope (TEM), specimens for the microscopy. Electron diffraction (scattering on an atom and a lattice, point diffraction pattern, Ewald construction, deviation from the exact reflection condition). TEM diffraction contrast (extinction contours, contrast of crystal defects). Kinematical and dynamical theory of contrast. Kikuchi lines. Practical tasks of electron diffraction and TEM. Application of stereology. High resolution electron microscopy HVEM (ideal imaging, influence of the real microscope, thin phase object, transmission function). Microdiffraction, CBED. Scanning electron microscopy (SEM), X-ray microanalysis.
Language of instruction
Czech
Further comments (probably available only in Czech)
The course can also be completed outside the examination period.
The course is taught once in two years.
General note: S.
The course is also listed under the following terms Autumn 1999, Autumn 2010 - only for the accreditation, Autumn 2001, Autumn 2003, Autumn 2006, Autumn 2008, Autumn 2010, Autumn 2011 - acreditation, Autumn 2012, Autumn 2014, Autumn 2016, Autumn 2018, Autumn 2019, Autumn 2020.
  • Enrolment Statistics (Autumn 2004, recent)
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