F7320 Atomic force microscopy and other methods of scanning probe microscopy

Faculty of Science
Autumn 2005
Extent and Intensity
2/0. 2 credit(s). Type of Completion: k (colloquium).
Teacher(s)
prof. RNDr. Ivan Ohlídal, DrSc. (lecturer)
Guaranteed by
prof. RNDr. Jan Janča, DrSc.
Department of Physical Electronics - Physics Section - Faculty of Science
Contact Person: prof. RNDr. Ivan Ohlídal, DrSc.
Timetable
Thu 12:00–13:50 Fs1,01017
Prerequisites
It is necessary to pass out the subject F1030 Mechanics and Molecular Physics.
Course Enrolment Limitations
The course is also offered to the students of the fields other than those the course is directly associated with.
fields of study / plans the course is directly associated with
Course objectives
Atomic force microscopy (AFM) is the most employed method from the methods of scanning probe microscopy. During the last ten years AFM has a considerable utilisation in many fields of both the fundamental and applied researches. Its use starts in practice as well. The same statements are true for scannig tunneling microscopy (STM), magnetic force microscopy (MFM), scanning thermic microscopy (STEM), scanning near optics microscopy (SNOM) etc. in a smaller measure. In this lecture theoretical principles of the interaction between the tip of the microscope and the surfaces of samples studied by AFM are described within different approaches of classical physics. This interaction is studied in connection with the two basic modes of AFM, i.e. in connection with a non-contact and contact modes. Further a construction of the atomic force microscope used in practice is decribed. The influence of the force interaction between the tip of the microscope and the surface of the sample on working the whole microscope is presented (in this way a detection by the microscope is described). Basic methods of calibrating the atomic force microscopes are mentioned briefly. A considerable attention is devoted to applying AFM in practice. The applications concerning investigations of surface roughness, upper boundaries of various thin films and structure of these films are discussed mainly. Applications of AFM in biophysics, biology, chemistry and medicine are mentioned too. A possibility of combining AFM with the other methods (e.g. optical methods) are noted as well. Within the lecture the principles of STM, MFM, STEM and SNOM are also explained. Both the theoretical and experimental aspects of these techniques are studied. Applications of STM, MSM, TSM and SNOM are also specified in a brief way. The lecture is completed by many images recorded using the techniques mentioned above at analyzing of various objects taking place in physical research, researches in the other sciences and practice.
Syllabus
  • 1. Different theoretical approaches at the description of the interaction between the tip of the microscope and the surface of the object studied (no-contact and contact modes). 2. Discussion of these approaches from the point of their use in atomic force microscopy (AFM). 3. Experimental set up of the typical AFM microscope. 4. Influence the force interaction between the tip and the surface on working the AFM microscope (record of the relief of the sample under study). 5. Basic methods of calibrating the AFM microscope. 6. Aplication of AFM at analyzing surface roughness,upper boundaries of the thi films and structure of these films. 7. Other application of AFM in biology, biophysics, chemistry and medicine. 8. Combination of AFM with the other methods (e.g. optical methods) at analyzing both surfaces of solids and thin films. 9. Theoretical and experimental principles of magnetic force microscopy (MFM), scanning thermic microscopy (STEM), scanning tunneling microscopy (STM) and scanning near optics microscopy (SNOM). 10. Applications of MFM, STEM, STM and SNOM in practice. 11. Comparison of AFM, MSM, STEM, STM and SNOM:
Assessment methods (in Czech)
Přenáška, předmět ukončen kolokviem.
Language of instruction
Czech
Further Comments
The course is taught annually.
The course is also listed under the following terms Autumn 2007 - for the purpose of the accreditation, Autumn 2010 - only for the accreditation, Autumn 2002, Autumn 2003, Autumn 2004, Autumn 2006, Autumn 2007, Autumn 2008, Autumn 2009, Autumn 2010, Autumn 2011, Autumn 2011 - acreditation, spring 2012 - acreditation, Autumn 2012, Autumn 2013, Autumn 2014, Autumn 2015, Autumn 2016, autumn 2017, Autumn 2018, Autumn 2019, Autumn 2020.
  • Enrolment Statistics (Autumn 2005, recent)
  • Permalink: https://is.muni.cz/course/sci/autumn2005/F7320