FX004 Surfaces and thin layers

Faculty of Science
autumn 2017
Extent and Intensity
2/1. 5 credit(s). Type of Completion: zk (examination).
doc. RNDr. Karel Navrátil, CSc. (lecturer)
doc. RNDr. Karel Navrátil, CSc. (seminar tutor)
Guaranteed by
prof. RNDr. Josef Humlíček, CSc.
Department of Condensed Matter Physics - Physics Section - Faculty of Science
Contact Person: doc. RNDr. Karel Navrátil, CSc.
Supplier department: Department of Condensed Matter Physics - Physics Section - Faculty of Science
Course Enrolment Limitations
The course is offered to students of any study field.
Course objectives
Main objectives can be summarized as follows: problem of the technological generation of 2D structures, the growth mechanism of those structures, understanding the relation between physical properties of metallic, semiconducting and dielectric thin films and the processes of their preparation. Dimensional effect.
  • Thin film deposition technology. Thickness measurement and analytical techniques. Nucleation and growth of thin films. Mechanical properties. Electron transport in thin films. Optical properties of layers. Applications of thin films.
  • K.L.Chopra, Tnin film phenomena (McGraw Hill, 1969)
Assessment methods
Oral examination
Language of instruction
Further comments (probably available only in Czech)
The course is taught annually.
The course is taught: every week.
General note: Předmět určen pro studenty Fyzikálního inženýrství VUT.
The course is also listed under the following terms Autumn 2007 - for the purpose of the accreditation, Autumn 2010 - only for the accreditation, Autumn 2002, Autumn 2003, Autumn 2004, Autumn 2005, Autumn 2006, Autumn 2007, Autumn 2008, Autumn 2009, Autumn 2010, Autumn 2011, Autumn 2011 - acreditation, spring 2012 - acreditation, Autumn 2012, Autumn 2013, Autumn 2014, Autumn 2015, Autumn 2016, Autumn 2019, Autumn 2020.
  • Enrolment Statistics (autumn 2017, recent)
  • Permalink: https://is.muni.cz/course/sci/autumn2017/FX004