PřF:F7840 Electron microscopy of solids - Course Information
F7840 Electron microscopy and its applications in materials researchFaculty of Science
- Extent and Intensity
- 2/0/0. 1 credit(s) (plus extra credits for completion). Type of Completion: k (colloquium).
- RNDr. Jiří Buršík, DSc. (lecturer)
prof. Mgr. Tomáš Kruml, CSc. (lecturer), prof. RNDr. Josef Humlíček, CSc. (deputy)
- Guaranteed by
- prof. RNDr. Josef Humlíček, CSc.
Department of Condensed Matter Physics - Physics Section - Faculty of Science
Contact Person: RNDr. Jiří Buršík, DSc.
Supplier department: Department of Condensed Matter Physics - Physics Section - Faculty of Science
- Course Enrolment Limitations
- The course is also offered to the students of the fields other than those the course is directly associated with.
- fields of study / plans the course is directly associated with
- Physics (programme PřF, N-FY)
- Course objectives
- Students will get familiar with principles of electron microscopy (both transmission and scanning e. m.). Basics of theory of imaging and diffraction will be discussed; an attention will be paid also to various analytical methods and any novelties in the field of electron microscopy. Lectures will be supplemented by several practical sessions at lecturers' institute.
- Interaction of electrons with solids, types of electron microscopes. Imaging in a transmission electron microscope (TEM), specimens for the microscopy. Electron diffraction (scattering on an atom and a lattice, point diffraction pattern, Ewald construction, deviation from the exact reflection condition). TEM diffraction contrast (extinction contours, contrast of crystal defects). Kinematical and dynamical theory of contrast. Kikuchi lines. Practical tasks of electron diffraction and TEM. Application of stereology. High resolution electron microscopy HVEM (ideal imaging, influence of the real microscope, thin phase object, transmission function). Microdiffraction, CBED. Scanning electron microscopy (SEM), X-ray microanalysis.
- KARLÍK, Miroslav. Úvod do transmisní elektronové mikroskopie. Vyd. 1. Praha: České vysoké učení technické v Praze, 2011. 321 s. ISBN 9788001047293. info
- GOLDSTEIN, Joseph I. Scanning electron microscopy and X-ray microanalysis. 3rd ed. New York: Kluwer Academic/Plenum publishers, 2003. xix, 689 s. ISBN 0-306-47292-9. info
- Transmission electron microscopy : physics of image formation and microanalysis. Edited by Ludwig Reimer. 3. ed. Berlin: Springer, 1993. 545 s. ISBN 3540568492. info
- Teaching methods
- lectures, 2-3 practical sessions
- Assessment methods
- Language of instruction
- Further comments (probably available only in Czech)
- The course can also be completed outside the examination period.
The course is taught once in two years.
The course is taught: every week.
General note: S.
- Enrolment Statistics (recent)
- Permalink: https://is.muni.cz/course/sci/autumn2019/F7840