Data Analysis for Nanomaterials: Effective Medium
Approximation, Its Limits and Implementations

C 2013

Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations

HUMLÍČEK, Josef

Základní údaje

Originální název

Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations

Autoři

HUMLÍČEK, Josef (203 Česká republika, garant, domácí)

Vydání

Berlin, Ellipsometry at the Nanoscale, od s. 145-178, 34 s. 2013

Nakladatel

Springer

Další údaje

Jazyk

angličtina

Typ výsledku

Kapitola resp. kapitoly v odborné knize

Obor

10302 Condensed matter physics

Stát vydavatele

Německo

Utajení

není předmětem státního či obchodního tajemství

Forma vydání

tištěná verze "print"

Odkazy

URL

Kód RIV

RIV/00216224:14740/13:00068200

Organizační jednotka

Středoevropský technologický institut

ISBN

978-3-642-33955-4

DOI

http://dx.doi.org/10.1007/978-3-642-33956-1_3

Klíčová slova anglicky

optical spectra; effective medium

Štítky

rivok

Příznaky

Mezinárodní význam, Recenzováno

Změněno: 9. 4. 2014 10:59, Olga Křížová

Anotace

V originále

We review here basic theoretical approaches to the optical response of nanostructured materials. We use the well established framework of Effective medium approximation (EMA) and discuss key issues of its use. The treatment of this extensive subject is adapted to the needs of ellipsometric/polarimetric measurements on nanostructured materials. In Sects. 3.1 and 3.2 we formulate the problems and establish notation. Then, we recall and discuss, in Sects. 3.3 and 3.4, several well-known formulae for the effective dielectric function. Sections 3.5 and 3.6 are devoted to a fairly detailed comparison of selected measured data with results of the EMA models. We also assess the uncertainties involved in the EMA approach by visualizing the differences between results of its different versions (Sect. 3.7) and by calculating the differences from exact solutions (Sect. 3.8). Finally, Sect. 3.9 is devoted to the discussion of possible resonant behaviour of EMA mixtures.

Návaznosti

ED1.1.00/02.0068, projekt VaV

Název: CEITEC - central european institute of technology

MSM0021622410, záměr

Název: Fyzikální a chemické vlastnosti pokročilých materiálů a struktur

Investor: Ministerstvo školství, mládeže a tělovýchovy ČR, Fyzikální a chemické vlastnosti pokročilých materiálů a struktur

Citovat

HUMLÍČEK, Josef. Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations. In Maria Losurdo; Kurt Hingerl. Ellipsometry at the Nanoscale. Berlin: Springer, 2013, s. 145-178. ISBN 978-3-642-33955-4. Dostupné z: https://dx.doi.org/10.1007/978-3-642-33956-1_3.

@inbook{1104912,
   author = {Humlíček, Josef},
   address = {Berlin},
   booktitle = {Ellipsometry at the Nanoscale},
   doi = {http://dx.doi.org/10.1007/978-3-642-33956-1_3},
   editor = {Maria Losurdo; Kurt Hingerl},
   keywords = {optical spectra; effective medium},
   howpublished = {tištěná verze "print"},
   language = {eng},
   location = {Berlin},
   isbn = {978-3-642-33955-4},
   pages = {145-178},
   publisher = {Springer},
   title = {Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations},
   url = {http://www.springer.com/engineering/book/978-3-642-33955-4},
   year = {2013}
}

TY  - CHAP
ID  - 1104912
AU  - Humlíček, Josef
PY  - 2013
TI  - Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations
VL  - Neuveden
PB  - Springer
CY  - Berlin
SN  - 9783642339554
KW  - optical spectra
KW  - effective medium
UR  - http://www.springer.com/engineering/book/978-3-642-33955-4
L2  - http://www.springer.com/engineering/book/978-3-642-33955-4
N2  - We review here basic theoretical approaches to the optical response of nanostructured materials. We use the well established framework of Effective medium approximation (EMA) and discuss key issues of its use. The treatment of this extensive subject is adapted to the needs of ellipsometric/polarimetric measurements on nanostructured materials. In Sects. 3.1 and 3.2 we formulate the problems and establish notation. Then, we recall and discuss, in Sects. 3.3 and 3.4, several well-known formulae for the effective dielectric function. Sections 3.5 and 3.6 are devoted to a fairly detailed comparison of selected measured data with results of the EMA models. We also assess the uncertainties involved in the EMA approach by visualizing the differences between results of its different versions (Sect. 3.7) and by calculating the differences from exact solutions (Sect. 3.8). Finally, Sect. 3.9 is devoted to the discussion of possible resonant behaviour of EMA mixtures.
ER  -

HUMLÍČEK, Josef. Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations. In Maria Losurdo; Kurt Hingerl. \textit{Ellipsometry at the Nanoscale}. Berlin: Springer, 2013, s.~145-178. ISBN~978-3-642-33955-4. Dostupné z: https://dx.doi.org/10.1007/978-3-642-33956-1\_{}3.

Podrobný výpis o publikaci