2017
Ti atom and Ti ion number density evolution in standard and multi-pulse HiPIMS
FEKETE, Matej, Jaroslav HNILICA, Catalin VITELARU, Tiberiu MINEA, Petr VAŠINA et. al.Základní údaje
Originální název
Ti atom and Ti ion number density evolution in standard and multi-pulse HiPIMS
Autoři
FEKETE, Matej (703 Slovensko, domácí), Jaroslav HNILICA (203 Česká republika, domácí), Catalin VITELARU (642 Rumunsko), Tiberiu MINEA (250 Francie) a Petr VAŠINA (203 Česká republika, garant, domácí)
Vydání
Journal of Physics D: Applied Physics, Bristol, IOP PUBLISHING LTD, 2017, 0022-3727
Další údaje
Jazyk
angličtina
Typ výsledku
Článek v odborném periodiku
Obor
10305 Fluids and plasma physics
Stát vydavatele
Velká Británie a Severní Irsko
Utajení
není předmětem státního či obchodního tajemství
Odkazy
Impakt faktor
Impact factor: 2.373
Kód RIV
RIV/00216224:14310/17:00094893
Organizační jednotka
Přírodovědecká fakulta
UT WoS
000415299900001
Klíčová slova anglicky
magnetron sputtering; HiPIMS; plasma diagnostics; EBF; TD-LAS; m-HiPIMS
Příznaky
Mezinárodní význam, Recenzováno
Změněno: 12. 4. 2018 15:40, Ing. Nicole Zrilić
Anotace
V originále
In this paper, comparison of standard and multi-pulse high power impulse magnetron sputtering is performed. The effective branching fraction method is used for titanium atom and ion number density determination, showing that the residual titanium atoms and ions from the preceding pulse are crucial for the subsequent pulse initiation and development. It is shown that the discharge current rises faster in the subsequent pulse, but does not reach the same maximum as in the preceding pulse. The time evolution of the titanium atom density shows different behaviour, initial increase is followed by decrease in the preceding pulse and a rather constant evolution during the subsequent pulse. As for the titanium ion number density, it reaches typically lower values in the subsequent pulse, approaching the maximum values from the preceding pulse only at long delays of 1.5 ms. The most significant increase of the total ion flux to the substrate, namely 43% increase with respect to standard high power impulse magnetron sputtering, is observed in the multi-pulse high power impulse magnetron sputtering with the shortest studied delay of 200 us. The residual titanium atoms produced by the preceding pulse are already thermalized at the beginning of the subsequent pulse, thus being available for ionization during the subsequent pulse. The reservoir of these thermalized atoms gets depleted as the delay increases. However, even for the longest studied delay of 1.5 ms the influence of the preceding pulse on the subsequent pulse is still distinct, including the enhancement of the total ion flux to the substrate by 23%.
Návaznosti
ED2.1.00/03.0086, projekt VaV |
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GAP205/12/0407, projekt VaV |
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GA15-00863S, projekt VaV |
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LO1411, projekt VaV |
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