MEDUŇA, Mojmír, Fabio ISA, Arik JUNG, Anna MARZEGALLI, Marco ALBANI, Giovanni ISELLA, Kai ZWEIACKER, Leo MIGLIO a Hans VON KÄNEL. Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals. Journal of Applied Crystallography. Chester: INT UNION CRYSTALLOGRAPHY, 2018, roč. 51, č. 2, s. 368-385. ISSN 1600-5767. Dostupné z: https://dx.doi.org/10.1107/S1600576718001450. |
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@article{1406719, author = {Meduňa, Mojmír and Isa, Fabio and Jung, Arik and Marzegalli, Anna and Albani, Marco and Isella, Giovanni and Zweiacker, Kai and Miglio, Leo and von Känel, Hans}, article_location = {Chester}, article_number = {2}, doi = {http://dx.doi.org/10.1107/S1600576718001450}, keywords = {scanning X-ray nanodiffraction; lattice bending; graded SiGe microcrystals; strain relaxation}, language = {eng}, issn = {1600-5767}, journal = {Journal of Applied Crystallography}, title = {Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals}, url = {https://onlinelibrary.wiley.com/iucr/doi/10.1107/S1600576718001450}, volume = {51}, year = {2018} }
TY - JOUR ID - 1406719 AU - Meduňa, Mojmír - Isa, Fabio - Jung, Arik - Marzegalli, Anna - Albani, Marco - Isella, Giovanni - Zweiacker, Kai - Miglio, Leo - von Känel, Hans PY - 2018 TI - Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals JF - Journal of Applied Crystallography VL - 51 IS - 2 SP - 368-385 EP - 368-385 PB - INT UNION CRYSTALLOGRAPHY SN - 16005767 KW - scanning X-ray nanodiffraction KW - lattice bending KW - graded SiGe microcrystals KW - strain relaxation UR - https://onlinelibrary.wiley.com/iucr/doi/10.1107/S1600576718001450 N2 - The scanning X-ray nanodiffraction technique is used to reconstruct the three- dimensional (3D) distribution of lattice strain and Ge concentration in compositionally graded Si1-xGex microcrystals epitaxially grown on Si pillars. ER -
MEDUŇA, Mojmír, Fabio ISA, Arik JUNG, Anna MARZEGALLI, Marco ALBANI, Giovanni ISELLA, Kai ZWEIACKER, Leo MIGLIO a Hans VON KÄNEL. Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals. \textit{Journal of Applied Crystallography}. Chester: INT UNION CRYSTALLOGRAPHY, 2018, roč.~51, č.~2, s.~368-385. ISSN~1600-5767. Dostupné z: https://dx.doi.org/10.1107/S1600576718001450.
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