Universal Dispersion Model for Characterization of Thin Films
Over Wide Spectral Range

C 2018

Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range

FRANTA, Daniel, Jiří VOHÁNKA a Martin ČERMÁK

Základní údaje

Originální název

Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range

Autoři

FRANTA, Daniel (203 Česká republika, domácí), Jiří VOHÁNKA (203 Česká republika, domácí) a Martin ČERMÁK (203 Česká republika, domácí)

Vydání

Cham, Optical Characterization of Thin Solid Films, od s. 31-82, 52 s. Springer Series in Surface Sciences, volume 64, 2018

Nakladatel

Springer

Další údaje

Jazyk

angličtina

Typ výsledku

Kapitola resp. kapitoly v odborné knize

Obor

10306 Optics

Stát vydavatele

Švýcarsko

Utajení

není předmětem státního či obchodního tajemství

Forma vydání

tištěná verze "print"

Odkazy

odkaz na stránku nakladatele

Kód RIV

RIV/00216224:14310/18:00104688

Organizační jednotka

Přírodovědecká fakulta

ISBN

978-3-319-75324-9

DOI

http://dx.doi.org/10.1007/978-3-319-75325-6_3

UT WoS

000441388800005

Klíčová slova anglicky

Dispersion models;Dielectric response;Damped harmonic oscillators;Coupled modes;Parametrization of the joint density of states

Štítky

topvydavatel

Změněno: 28. 11. 2018 15:32, Mgr. Jiří Vohánka, Ph.D.

Anotace

V originále

The universal dispersion model is a collection of dispersion models (contributions to the dielectric response) describing individual elementary excitation in solids. All contributions presented in this chapter satisfy the basic conditions that follow from the theory of dispersion (time reversal symmetry, Kramers--Kronig consistency and finite sum rule integral). The individual contributions are presented in an unified formalism. In this formalism the spectral distributions of the contributions are parameterized using dispersion functions normalized with respect to the sum rule. These normalized dispersion functions must be multiplied by the transition strengths parameters which can be related to the density of charged particles. The separation of contributions into the transitions strengths and normalized spectral distributions is beneficial since it allows us to elegantly introduce the temperature dependencies into these models.

Návaznosti

LO1411, projekt VaV

Název: Rozvoj centra pro nízkonákladové plazmové a nanotechnologické povrchové úpravy (Akronym: CEPLANT plus)

Investor: Ministerstvo školství, mládeže a tělovýchovy ČR, Rozvoj centra pro nízkonákladové plazmové a nanotechnologické povrchové úpravy

Citovat

FRANTA, Daniel, Jiří VOHÁNKA a Martin ČERMÁK. Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range. In Olaf Stenzel, Miloslav Ohlídal. Optical Characterization of Thin Solid Films. Cham: Springer, 2018, s. 31-82. Springer Series in Surface Sciences, volume 64. ISBN 978-3-319-75324-9. Dostupné z: https://dx.doi.org/10.1007/978-3-319-75325-6_3.

@inbook{1472965,
   author = {Franta, Daniel and Vohánka, Jiří and Čermák, Martin},
   address = {Cham},
   booktitle = {Optical Characterization of Thin Solid Films},
   doi = {http://dx.doi.org/10.1007/978-3-319-75325-6_3},
   editor = {Olaf Stenzel, Miloslav Ohlídal},
   keywords = {Dispersion models;Dielectric response;Damped harmonic oscillators;Coupled modes;Parametrization of the joint density of states},
   howpublished = {tištěná verze "print"},
   language = {eng},
   location = {Cham},
   isbn = {978-3-319-75324-9},
   pages = {31-82},
   publisher = {Springer},
   title = {Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range},
   url = {https://link.springer.com/chapter/10.1007/978-3-319-75325-6_3},
   year = {2018}
}

TY  - CHAP
ID  - 1472965
AU  - Franta, Daniel - Vohánka, Jiří - Čermák, Martin
PY  - 2018
TI  - Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range
VL  - Springer Series in Surface Sciences, volume 64
PB  - Springer
CY  - Cham
SN  - 9783319753249
KW  - Dispersion models;Dielectric response;Damped harmonic oscillators;Coupled modes;Parametrization of the joint density of states
UR  - https://link.springer.com/chapter/10.1007/978-3-319-75325-6_3
L2  - https://link.springer.com/chapter/10.1007/978-3-319-75325-6_3
N2  - The universal dispersion model is a collection of dispersion models (contributions to the dielectric response) describing individual elementary excitation in solids. All contributions presented in this chapter satisfy the basic conditions that follow from the theory of dispersion (time reversal symmetry, Kramers--Kronig consistency and finite sum rule integral). The individual contributions are presented in an unified formalism. In this formalism the spectral distributions of the contributions are parameterized using dispersion functions normalized with respect to the sum rule. These normalized dispersion functions must be multiplied by the transition strengths parameters which can be related to the density of charged particles. The separation of contributions into the transitions strengths and normalized spectral distributions is beneficial since it allows us to elegantly introduce the temperature dependencies into these models.
ER  -

FRANTA, Daniel, Jiří VOHÁNKA a Martin ČERMÁK. Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range. In Olaf Stenzel, Miloslav Ohlídal. \textit{Optical Characterization of Thin Solid Films}. Cham: Springer, 2018, s.~31-82. Springer Series in Surface Sciences, volume 64. ISBN~978-3-319-75324-9. Dostupné z: https://dx.doi.org/10.1007/978-3-319-75325-6\_{}3.

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