Use of the Richardson extrapolation in optics of inhomogeneous
layers: Application to optical characterization

J 2018

Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization

VOHÁNKA, Jiří, Ivan OHLÍDAL, Jaroslav ŽENÍŠEK, Petr VAŠINA, Martin ČERMÁK et. al.

Základní údaje

Originální název

Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization

Autoři

VOHÁNKA, Jiří (203 Česká republika, domácí), Ivan OHLÍDAL (203 Česká republika, domácí), Jaroslav ŽENÍŠEK (203 Česká republika, domácí), Petr VAŠINA (203 Česká republika, domácí), Martin ČERMÁK (203 Česká republika, domácí) a Daniel FRANTA (203 Česká republika, domácí)

Vydání

Surface and Interface Analysis, Wiley, 2018, 0142-2421

Další údaje

Jazyk

angličtina

Typ výsledku

Článek v odborném periodiku

Obor

10306 Optics

Stát vydavatele

Spojené státy

Utajení

není předmětem státního či obchodního tajemství

Odkazy

odkaz na stránku nakladatele

Impakt faktor

Impact factor: 1.319

Kód RIV

RIV/00216224:14310/18:00104689

Organizační jednotka

Přírodovědecká fakulta

DOI

http://dx.doi.org/10.1002/sia.6473

UT WoS

000434647100011

Klíčová slova anglicky

ellipsometry;inhomogeneous layers;optical characterization;silicon nitride

Změněno: 2. 5. 2019 16:16, Mgr. Tereza Miškechová

Anotace

V originále

A new approach to calculation of optical quantities of inhomogeneous layers is presented. In this approach, the Richardson extrapolation is used to improve the accuracy of the method, in which the inhomogeneous layer is approximated by a stack of thin homogeneous layers. The results presented in this paper are based on the assumption that the media are isotropic and the inhomogeneity is along the axis normal to the boundary. The results obtained by the new method are compared with those obtained without the Richardson extrapolation. The Richardson extrapolation brings significant improvement in accuracy, especially if the number of approximating layers is large. Moreover, the method using the Richardson extrapolation proceeds in steps with an error estimate available in each step; thus, the calculation can be stopped when the desired accuracy is reached. The use of the method is illustrated by means of the optical characterization of strongly inhomogeneous film of non-stoichiometric silicon nitride.

Návaznosti

LO1411, projekt VaV

Název: Rozvoj centra pro nízkonákladové plazmové a nanotechnologické povrchové úpravy (Akronym: CEPLANT plus)

Investor: Ministerstvo školství, mládeže a tělovýchovy ČR, Rozvoj centra pro nízkonákladové plazmové a nanotechnologické povrchové úpravy

Citovat

VOHÁNKA, Jiří, Ivan OHLÍDAL, Jaroslav ŽENÍŠEK, Petr VAŠINA, Martin ČERMÁK a Daniel FRANTA. Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization. Surface and Interface Analysis. Wiley, 2018, roč. 50, č. 7, s. 757-765. ISSN 0142-2421. Dostupné z: https://dx.doi.org/10.1002/sia.6473.

@article{1472976,
   author = {Vohánka, Jiří and Ohlídal, Ivan and Ženíšek, Jaroslav and Vašina, Petr and Čermák, Martin and Franta, Daniel},
   article_number = {7},
   doi = {http://dx.doi.org/10.1002/sia.6473},
   keywords = {ellipsometry;inhomogeneous layers;optical characterization;silicon nitride},
   language = {eng},
   issn = {0142-2421},
   journal = {Surface and Interface Analysis},
   title = {Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization},
   url = {https://onlinelibrary.wiley.com/doi/abs/10.1002/sia.6473},
   volume = {50},
   year = {2018}
}

TY  - JOUR
ID  - 1472976
AU  - Vohánka, Jiří - Ohlídal, Ivan - Ženíšek, Jaroslav - Vašina, Petr - Čermák, Martin - Franta, Daniel
PY  - 2018
TI  - Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization
JF  - Surface and Interface Analysis
VL  - 50
IS  - 7
SP  - 757-765
EP  - 757-765
PB  - Wiley
SN  - 01422421
KW  - ellipsometry;inhomogeneous layers;optical characterization;silicon nitride
UR  - https://onlinelibrary.wiley.com/doi/abs/10.1002/sia.6473
L2  - https://onlinelibrary.wiley.com/doi/abs/10.1002/sia.6473
N2  - A new approach to calculation of optical quantities of inhomogeneous layers is presented. In this approach, the Richardson extrapolation is used to improve the accuracy of the method, in which the inhomogeneous layer is approximated by a stack of thin homogeneous layers. The results presented in this paper are based on the assumption that the media are isotropic and the inhomogeneity is along the axis normal to the boundary. The results obtained by the new method are compared with those obtained without the Richardson extrapolation. The Richardson extrapolation brings significant improvement in accuracy, especially if the number of approximating layers is large. Moreover, the method using the Richardson extrapolation proceeds in steps with an error estimate available in each step; thus, the calculation can be stopped when the desired accuracy is reached. The use of the method is illustrated by means of the optical characterization of strongly inhomogeneous film of non-stoichiometric silicon nitride.
ER  -

VOHÁNKA, Jiří, Ivan OHLÍDAL, Jaroslav ŽENÍŠEK, Petr VAŠINA, Martin ČERMÁK a Daniel FRANTA. Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization. \textit{Surface and Interface Analysis}. Wiley, 2018, roč.~50, č.~7, s.~757-765. ISSN~0142-2421. Dostupné z: https://dx.doi.org/10.1002/sia.6473.

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