2019
LA-ICP-MS analysis of metal layers on samples of cultural heritage
VANÍČKOVÁ, Elena; Markéta HOLÁ; Karel RAPOUCH; David PAVLIŇÁK; Radka KOPECKÁ et. al.Basic information
Original name
LA-ICP-MS analysis of metal layers on samples of cultural heritage
Authors
VANÍČKOVÁ, Elena (203 Czech Republic, belonging to the institution); Markéta HOLÁ (203 Czech Republic, guarantor, belonging to the institution); Karel RAPOUCH (203 Czech Republic, belonging to the institution); David PAVLIŇÁK (203 Czech Republic, belonging to the institution); Radka KOPECKÁ (203 Czech Republic, belonging to the institution) and Viktor KANICKÝ (203 Czech Republic, belonging to the institution)
Edition
Chemical Papers, Cham, SPRINGER INTERNATIONAL PUBLISHING AG, 2019, 2585-7290
Other information
Language
English
Type of outcome
Article in a journal
Field of Study
10400 1.4 Chemical sciences
Country of publisher
Switzerland
Confidentiality degree
is not subject to a state or trade secret
References:
RIV identification code
RIV/00216224:14310/19:00110379
Organization unit
Faculty of Science
UT WoS
000488930200006
EID Scopus
2-s2.0-85073209463
Keywords in English
Laser ablation; Inductively coupled plasma mass spectrometry; Depth profiling; X-ray fluorescence spectroscopy; Metal layer
Tags
Tags
International impact, Reviewed
Changed: 22/2/2023 15:26, Mgr. Marie Novosadová Šípková, DiS.
Abstract
In the original language
LA-ICP-MS (laser ablation inductively coupled plasma mass spectrometry) was applied as a semi-destructive method for the analysis of metal layers on samples of cultural heritage. The LA system operates at a wavelength of 193 nm with a pulse duration of 4 ns. The laser ablation was performed using spot mode with a diameter of 110 mu m. This method was developed using eight varied reference samples with a defined layer depth and composition. Four real samples of watch cases were analysed, and the layer composition and thickness were determined together with two test reference samples. The analytical results were compared with X-ray fluorescence spectroscopy analysis. The layer thickness was additionally determined by scanning electron microscopy on the cross section of selected samples.
Links
LO1411, research and development project |
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LQ1601, research and development project |
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