CARPENTIER, Corina, Anna DAHLHAUS, de Giesen Nick VAN and Blahoslav MARŠÁLEK. The influence of hard substratum reflection and calibration profiles on in situ fluorescence measurements of benthic microalgal biomass. ENVIRONMENTAL SCIENCE-PROCESSES & IMPACTS. CAMBRIDGE: ROYAL SOC CHEMISTRY, 2013, vol. 15, No 4, p. 783-793. ISSN 2050-7887. Available from: https://dx.doi.org/10.1039/c3em30654b.
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Basic information
Original name The influence of hard substratum reflection and calibration profiles on in situ fluorescence measurements of benthic microalgal biomass
Authors CARPENTIER, Corina, Anna DAHLHAUS, de Giesen Nick VAN and Blahoslav MARŠÁLEK (203 Czech Republic, belonging to the institution).
Edition ENVIRONMENTAL SCIENCE-PROCESSES & IMPACTS, CAMBRIDGE, ROYAL SOC CHEMISTRY, 2013, 2050-7887.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10511 Environmental sciences
Country of publisher United Kingdom of Great Britain and Northern Ireland
Confidentiality degree is not subject to a state or trade secret
WWW Full Text
RIV identification code RIV/00216224:14310/13:00107103
Organization unit Faculty of Science
Doi http://dx.doi.org/10.1039/c3em30654b
UT WoS 000316869900010
Keywords in English CHLOROPHYLL FLUORESCENCE; CYANOBACTERIA; VIVO; POPULATIONS; WATER
Tags rivok
Tags International impact, Reviewed
Changed by Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 17/12/2019 15:53.
Abstract
Measuring chlorophyll-a fluorescence is a commonly used method to determine microphytobenthic biomass expressed as chlorophyll-a per square centimetre. However, this in situ method is affected by reflection from the substratum which triggers an additional fluorescence signal within the microphytobenthic biofilm. Depending on the colour and texture of the natural substratum, this effect can lead to a considerable overestimation of microphytobenthic biomass. The results cannot be corrected for this effect by performing an auto-zero measurement, since the overestimation is not caused by an offset of the fluorometer. This article describes a substratum-specific correction procedure using a 700 nm signal to eliminate this effect by quantifying the fluorescence signal as a result of the reflection. An empirical relationship between the 700 nm signal and the additional fluorescence is used to calculate a correction factor for the reflective properties of the substratum. The factor is determined and applied during each biomass measurement, thereby making an additional calibration step for each individual type of substratum superfluous. This new method improves the reliability of the results significantly without increasing the time necessary to perform the measurements and without complicating the measurement procedure.
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