Characterization of Platinum-Based Thin Films Deposited by
Thermionic Vacuum Arc (TVA) Method

J 2020

Characterization of Platinum-Based Thin Films Deposited by Thermionic Vacuum Arc (TVA) Method

COZMA, Sebastian, Rodica VLADOIU, Aurelia MANDES, Virginia DINCA, Gabriel PRODAN et. al.

Základní údaje

Originální název

Characterization of Platinum-Based Thin Films Deposited by Thermionic Vacuum Arc (TVA) Method

Autoři

COZMA, Sebastian, Rodica VLADOIU, Aurelia MANDES, Virginia DINCA, Gabriel PRODAN a Vilma BURŠÍKOVÁ (203 Česká republika, garant, domácí)

Vydání

Materials, Basel, MDPI, 2020, 1996-1944

Další údaje

Jazyk

angličtina

Typ výsledku

Článek v odborném periodiku

Obor

10305 Fluids and plasma physics

Stát vydavatele

Švýcarsko

Utajení

není předmětem státního či obchodního tajemství

Odkazy

URL

Impakt faktor

Impact factor: 3.623

Kód RIV

RIV/00216224:14310/20:00116939

Organizační jednotka

Přírodovědecká fakulta

DOI

http://dx.doi.org/10.3390/ma13071796

UT WoS

000529875600314

Klíčová slova anglicky

Pt; PtTi thin films; TVA; morphological properties

Štítky

rivok

Příznaky

Mezinárodní význam, Recenzováno

Změněno: 29. 2. 2024 13:44, Mgr. Marie Šípková, DiS.

Anotace

V originále

The current work aimed to characterize the morphology, chemical, and mechanical properties of Pt and PtTi thin films deposited via thermionic vacuum arc (TVA) method on glass and silicon substrates. The deposited thin films were characterized by means of a scanning electron microscope technique (SEM). The quantitative elemental microanalysis was done using energy-dispersive X-ray spectroscopy (EDS). The tribological properties were studied by a ball-on-disc tribometer, and the mechanical properties were measured using nanoindentation tests. The roughness, as well as the micro and nanoscale features, were characterized using atomic force microscopy (AFM) and transmission electron microscopy (TEM). The wettability of the deposited Pt and PtTi thin films was investigated by the surface free energy evaluation (SFE) method. The purpose of our study was to prove the potential applications of Pt-based thin films in fields, such as nanoelectronics, fuel cells, medicine, and materials science.

Návaznosti

90097, velká výzkumná infrastruktura

Název: CEPLANT

Citovat

COZMA, Sebastian, Rodica VLADOIU, Aurelia MANDES, Virginia DINCA, Gabriel PRODAN a Vilma BURŠÍKOVÁ. Characterization of Platinum-Based Thin Films Deposited by Thermionic Vacuum Arc (TVA) Method. Materials. Basel: MDPI, 2020, roč. 13, č. 7, s. 1-13. ISSN 1996-1944. Dostupné z: https://dx.doi.org/10.3390/ma13071796.

@article{1693416,
   author = {Cozma, Sebastian and Vladoiu, Rodica and Mandes, Aurelia and Dinca, Virginia and Prodan, Gabriel and Buršíková, Vilma},
   article_location = {Basel},
   article_number = {7},
   doi = {http://dx.doi.org/10.3390/ma13071796},
   keywords = {Pt; PtTi thin films; TVA; morphological properties},
   language = {eng},
   issn = {1996-1944},
   journal = {Materials},
   title = {Characterization of Platinum-Based Thin Films Deposited by Thermionic Vacuum Arc (TVA) Method},
   url = {https://doi.org/10.3390/ma13071796},
   volume = {13},
   year = {2020}
}

TY  - JOUR
ID  - 1693416
AU  - Cozma, Sebastian - Vladoiu, Rodica - Mandes, Aurelia - Dinca, Virginia - Prodan, Gabriel - Buršíková, Vilma
PY  - 2020
TI  - Characterization of Platinum-Based Thin Films Deposited by Thermionic Vacuum Arc (TVA) Method
JF  - Materials
VL  - 13
IS  - 7
SP  - 1-13
EP  - 1-13
PB  - MDPI
SN  - 19961944
KW  - Pt
KW  - PtTi thin films
KW  - TVA
KW  - morphological properties
UR  - https://doi.org/10.3390/ma13071796
L2  - https://doi.org/10.3390/ma13071796
N2  - The current work aimed to characterize the morphology, chemical, and mechanical properties of Pt and PtTi thin films deposited via thermionic vacuum arc (TVA) method on glass and silicon substrates. The deposited thin films were characterized by means of a scanning electron microscope technique (SEM). The quantitative elemental microanalysis was done using energy-dispersive X-ray spectroscopy (EDS). The tribological properties were studied by a ball-on-disc tribometer, and the mechanical properties were measured using nanoindentation tests. The roughness, as well as the micro and nanoscale features, were characterized using atomic force microscopy (AFM) and transmission electron microscopy (TEM). The wettability of the deposited Pt and PtTi thin films was investigated by the surface free energy evaluation (SFE) method. The purpose of our study was to prove the potential applications of Pt-based thin films in fields, such as nanoelectronics, fuel cells, medicine, and materials science.
ER  -

COZMA, Sebastian, Rodica VLADOIU, Aurelia MANDES, Virginia DINCA, Gabriel PRODAN a Vilma BURŠÍKOVÁ. Characterization of Platinum-Based Thin Films Deposited by Thermionic Vacuum Arc (TVA) Method. \textit{Materials}. Basel: MDPI, 2020, roč.~13, č.~7, s.~1-13. ISSN~1996-1944. Dostupné z: https://dx.doi.org/10.3390/ma13071796.

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