Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer

KONVALINA, Ivo, Benjamin DANIEL, Martin ZOUHAR, Aleš PATÁK, Ilona MÜLLEROVÁ, Luděk FRANK, Jakub PIŇOS, Lukáš PRŮCHA, Tomáš RADLIČKA, Wolfgang S M WERNER a Eliška Materna MIKMEKOVÁ. Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer. NANOMATERIALS. SWITZERLAND: MDPI, 2021, roč. 11, č. 9, s. 2435-2452. ISSN 2079-4991. Dostupné z: https://dx.doi.org/10.3390/nano11092435.

Základní údaje

• Originální název: Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer
• Autoři: KONVALINA, Ivo, Benjamin DANIEL, Martin ZOUHAR, Aleš PATÁK, Ilona MÜLLEROVÁ, Luděk FRANK, Jakub PIŇOS, Lukáš PRŮCHA, Tomáš RADLIČKA, Wolfgang S M WERNER a Eliška Materna MIKMEKOVÁ.
• Vydání: NANOMATERIALS, SWITZERLAND, MDPI, 2021, 2079-4991.

Další údaje

• Typ výsledku: Článek v odborném periodiku
• Utajení: není předmětem státního či obchodního tajemství
• WWW: URL
• Impakt faktor: Impact factor: 5.719
• Doi: http://dx.doi.org/10.3390/nano11092435
• Klíčová slova česky: time-of-flight spectrometer; inelastic mean free path; density-functional theory; many-body perturbation theory; energy-loss spectrum; density of states; band structure; graphene
• Štítky: RIV ne

Anotace

The detailed examination of electron scattering in solids is of crucial importance for the theory of solid-state physics, as well as for the development and diagnostics of novel materials, particularly those for micro- and nanoelectronics. Among others, an important parameter of electron scattering is the inelastic mean free path (IMFP) of electrons both in bulk materials and in thin films, including 2D crystals. The amount of IMFP data available is still not sufficient, especially for very slow electrons and for 2D crystals. This situation motivated the present study, which summarizes pilot experiments for graphene on a new device intended to acquire electron energy-loss spectra (EELS) for low landing energies. Thanks to its unique properties, such as electrical conductivity and transparency, graphene is an ideal candidate for study at very low energies in the transmission mode of an electron microscope. The EELS are acquired by means of the very low-energy electron microspectroscopy of 2D crystals, using a dedicated ultra-high vacuum scanning low-energy electron microscope equipped with a time-of-flight (ToF) velocity analyzer. In order to verify our pilot results, we also simulate the EELS by means of density functional theory (DFT) and the many-body perturbation theory. Additional DFT calculations, providing both the total density of states and the band structure, illustrate the graphene loss features. We utilize the experimental EELS data to derive IMFP values using the so-called log-ratio method.