| HUMLÍČEK, Josef, K. KAMARAS a J. KIRCHER. Mid- and near - IR ellipsometry of Y 1-x Pr x Ba 2 Cu 3 O 7 epitaxial films. Thin Solid Films. UK Oxford: Elsevier science, 1993, roč. 234, č. 1, s. 518-521. ISSN 0040-6090. |
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@article{196773,
author = {Humlíček, Josef and Kamaras, K. and Kircher, J. and Habermeier, M. and Cardona, M.},
article_location = {UK Oxford},
article_number = {1},
language = {eng},
issn = {0040-6090},
journal = {Thin Solid Films},
title = {Mid- and near - IR ellipsometry of Y 1-x Pr x Ba 2 Cu 3 O 7 epitaxial films},
volume = {234},
year = {1993}
}
TY - JOUR
ID - 196773
AU - Humlíček, Josef - Kamaras, K. - Kircher, J. - Habermeier, M. - Cardona, M.
PY - 1993
TI - Mid- and near - IR ellipsometry of Y 1-x Pr x Ba 2 Cu 3 O 7 epitaxial films
JF - Thin Solid Films
VL - 234
IS - 1
SP - 518
EP - 518
PB - Elsevier science
SN - 00406090
ER -
HUMLÍČEK, Josef, K. KAMARAS a J. KIRCHER. Mid- and near - IR ellipsometry of Y 1-x Pr x Ba 2 Cu 3 O 7 epitaxial films. \textit{Thin Solid Films}. UK Oxford: Elsevier science, 1993, roč.~234, č.~1, s.~518-521. ISSN~0040-6090.
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