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@article{196774,
author = {Humlíček, Josef and Roeseler, Arnulf},
article_location = {UK Oxford},
article_number = {1},
language = {eng},
issn = {0040-6090},
journal = {Thin Solid Films},
title = {IR ellipsometry of the highly anisotropic materials alpha - SiO2 and alpha-Al2O3},
volume = {234},
year = {1993}
}
TY - JOUR
ID - 196774
AU - Humlíček, Josef - Roeseler, Arnulf
PY - 1993
TI - IR ellipsometry of the highly anisotropic materials alpha - SiO2 and alpha-Al2O3
JF - Thin Solid Films
VL - 234
IS - 1
SP - 332
EP - 332
PB - Elsevier science
SN - 00406090
ER -
HUMLÍČEK, Josef a Arnulf ROESELER. IR ellipsometry of the highly anisotropic materials alpha - SiO2 and alpha-Al2O3. \textit{Thin Solid Films}. UK Oxford: Elsevier science, 1993, roč.~234, č.~1, s.~332-336. ISSN~0040-6090.
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