| BOCHNÍČEK, Zdeněk, Václav HOLÝ, G. WOLF, H. STANZL a J. GEBHARDT. High Resolution x-ray diffractometry of ZnTe layers at elevated temperatures. Journal of Applied Physics. 1995, roč. 78, č. 2, s. 862-867. ISSN 0021-8979. |
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@article{197231,
author = {Bochníček, Zdeněk and Holý, Václav and Wolf, G. and Stanzl, H. and Gebhardt, J.},
article_number = {2},
language = {eng},
issn = {0021-8979},
journal = {Journal of Applied Physics},
title = {High Resolution x-ray diffractometry of ZnTe layers at elevated temperatures.},
volume = {78},
year = {1995}
}
TY - JOUR
ID - 197231
AU - Bochníček, Zdeněk - Holý, Václav - Wolf, G. - Stanzl, H. - Gebhardt, J.
PY - 1995
TI - High Resolution x-ray diffractometry of ZnTe layers at elevated temperatures.
JF - Journal of Applied Physics
VL - 78
IS - 2
SP - 862
EP - 862
SN - 00218979
ER -
BOCHNÍČEK, Zdeněk, Václav HOLÝ, G. WOLF, H. STANZL a J. GEBHARDT. High Resolution x-ray diffractometry of ZnTe layers at elevated temperatures. \textit{Journal of Applied Physics}. 1995, roč.~78, č.~2, s.~862-867. ISSN~0021-8979.
|
